With high-bandwidth optical communication technology, the 1.6T optical module achieves data transmission rate of 1.6 terabits per second through multi-wavelength multiplexing
The products exhibited by Semight, including silicon photonic wafer testing equipment sCT9001, wafer-level burn-in system WLBI3800, and packaging-level reliability testing equipment PLR0010, attracted by many industry professionals for discuss
CIOE is a leading exhibition for optoelectronics industry, covering optical communications, precision optics, lasers, smart manufacturing, and new display technology and so on.
At the SEMICON Show, we will showcase our cutting-edge solutions, including PB6600 SiC KGD Test System, WLBI3800 Wafer Level Burn-In System, and PLR0010 Package-Level Reliability Test Equipment.
Semight CR6256 is a compact, cost-effective and efficient desktop high-speed signal clock recovery unit, which supports either Non-Return-to-Zero (NRZ) or Pulse Amplitude Modulation 4-level (PAM4) signals clock recovery at 24.33-56.25Gbaud.
The rBT3250 50G Burst Mode Bit Error Ratio Tester is a newly developed burst BER analyzer specifically designed for testing Optical Line Terminals (OLTs) in next-generation 25G/50G Passive Optical Network (PON) applications. Its purpose is to evaluate the