Date:2024.07.26
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50G Burst Mode Bit Error Ratio Tester
The rBT3250 50G Burst Mode Bit Error Ratio Tester is a newly developed burst BER analyzer specifically designed for testing Optical Line Terminals (OLTs) in next-generation 25G/50G Passive Optical Network (PON) applications. Its purpose is to evaluate the performance of 25G and 50G OLT receivers in burst mode.
The rBT3250 50G Burst Mode Bit Error Ratio Tester features two independent burst pattern generator and BER detector channels. It supports both continuous mode and burst mode BER analysis. Additionally, it offers two burst time division pattern sequence generation and BER analysis capabilities, with flexible and adjustable pattern timing. To meet the testing requirements of devices, the corresponding test channel provides synchronous laser enable, reset signals, and other low-speed control channels. rBT3250 is equipped with built-in clock recovery, automatic ranging, and is suitable for conducting long fiber testing.
50GPON module testing
（a）
（b）
As shown in Figure (a), the 50G PON burst test environment is mainly composed of two ONU modules and one OLT module. The burst BER tester sends burst frame structures with data (preamble & Data) and laser enable signals (enable) alternately, so that the two ONU modules can send burst data alternately. This is done through the attenuator, simulating different lengths of optical fiber power attenuation. The splitting circuit breaker then synthesizes the light and accesses the OLT module. The burst BER tester ED sends reset signals to the OLT and receives burst data to compare the two burst BERs.
As shown in Figure （b）, during the double-burst test, the burst BER tester can fully detect the performance of the OLT module in receiving different optical powers and burst data lengths by configuring the burst frame lengths (preamble and data) of the two burst channels, as well as the amount of attenuation of the attenuator.
Characteristics & Advantages
1,Support burst and continuous mode signal output and BER test. Support 2 burst timing configurable code generator channels and 2 burst BER test channels.
2, Burst mode supports rates of 24.8832Gbps, 25.78125Gbps, 49.7664Gbps, and 51.5625Gbps.
3,Supports2-channel synchronous ONU laser enable control channel, with the control level being LVTTL 3.3V without external level conversion.
4，Supports 2-channel dual reset control channel, with adjustable reset position and width.
Product Applications
1，50G PON OLT module development and production testing.
2，Burst linear TIA chip test: needs to verify the working status of TIA (Transimpedance Amplifier) devices under burst signal conditions.
3，Some occasions have special requirements on code timing.
4，Multi-channel signal output, multichannel signal code synchronization, time delay synchronization.
Technical Indicators
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Pattern Generator Indicators |
Output | Differential,AC coupling , 100Ω terminal matching |
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Output amplitude |
Differential，100-600mVp-p |
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Output channel |
Burst Channel （50Gbps NRZ/PAM4) |
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Continuous channel （50Gbps NRZ/PAM4) |
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Pattern |
PRBS7，15，23，31，SSPR, User Defined and CID pattern |
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（20%~80%） Rise Time |
<12ps |
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Jitter（RMS） |
<0.9ps |
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Pattern sequence | Each channel supports the generation and editing of preamble code, protection time and load timing signals |
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CID pattern |
Supports continuous “1”,continuous “0” pattern as length from 64-128 bits(adjustable) |
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Clock output |
1/2、1/4、1/8、1/16 divided clock output |
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Connector |
2.4mm female,50Ω |
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RSSI trigger output | Supports RSSI trigger (adjustable for RSSI trigger signal pulse width, repeat frequency and position) |
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Error Detector Indicators |
Impedance |
Differential,AC coupling , 100Ω terminal matching |
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Amplitude |
100~800mVpp |
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Sensitivity |
＞100mV |
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Clock mode |
Built-in clock recovery |
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Connector |
2.4mm female,50Ω |
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