Wafer Acceptance Test
WAT6300
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WAT6210
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Serial Parametric Test tool for Wafer Acceptance Test
WAT6210 is the serial parametric test system for semiconductor manufacturing. WAT6210 offers the flexibilities in supporting various pin number, up to maximal 48 pins, and is compatible with mainstream WAT tester (Keysight 4070/4080) in terms of probe card, test plan and the probers used for WAT application.
WAT6600
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Parallel Parametric Test tool for Wafer Acceptance Test
Per-Pin SMU for parallel test with maximal 24 SMUs, less test time and high throughput, stable supply chain and fast delivery time
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