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Review of 25th China International Optoelectronic Exposition (CIOE)

2024.09.14

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Semight Silicon Photonics Testing Equipment Sparkles

2024.09.13

The products exhibited by Semight, including silicon photonic wafer testing equipment sCT9001, wafer-level burn-in system WLBI3800, and packaging-level reliability testing equipment PLR0010, attracted by many industry professionals for discuss

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Semight meets you at CIOE in Shenzhen on Sep 11 ~ 13

2024.08.25

CIOE is a leading exhibition for optoelectronics industry, covering optical communications, precision optics, lasers, smart manufacturing, and new display technology and so on.

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Semight showcases leading testing equipment to meet you at SEMICON TAIWAN 2024.

2024.08.18

At the SEMICON Show, we will showcase our cutting-edge solutions, including PB6600 SiC KGD Test System, WLBI3800 Wafer Level Burn-In System, and PLR0010 Package-Level Reliability Test Equipment.

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Semight "Favoured" by Visitors at electronica china

2024.07.11

The electronica china 2024 comes to a happy ending. Thanks to more than 200 visitors who showed up at our booth. We expect to see you again next year!

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Welcome to electronica China 2024! Semight, with its high precision SMU, is ready!

2024.07.02

electronica China 2024 will be held on July 8-10, 2024 at the Shanghai New International Expo Center.

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Semight in the spotlight at the show

2024.06.17

As the world's largest electronics and power supply chain event, PCIM Europe has a strong influence in the industry, and the exhibitions, technical forums, academic conferences,

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Semight presents the latest SiC KGD Test System at PCIM Europe

2024.05.29

Semight Insturments will showcase the latest semiconductor equipments including SiC KGD PB6600 test system, WLBI3800 Wafer-Level Burn-In system and WAT6300 High-Voltage Serial Parameter test system during the exhibition! Welcome！

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Welcome| Semight presents the latest semiconductor test systems at SEMICON SEA!

2024.05.17

Semight is going to showcase the latest SiC KGD test system PB6600, Wafer-Level Burn-In system WLBI3800, High-Voltage Serial Parameter Test System WAT6300 during the event.

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