Semight-Optical chip test-Laser Diode Test-Semight Instruments

English

简体中文日本語

home
Products
Products
Optical Network Test
Sampling Oscilloscope Clock Recovery Unit Burst Mode Bit Error Ratio Tester Bit Error Ratio Tester Network Tester Fast Wavelength Meter Optical Test Instrument High speed Transceiver ATE

Electronic Measurement
Benchtop Source Measure Unit PXIe Source Measure Unit High Voltage Source Measure Unit Low Leakage Switch Matrix Wafer Acceptance Test PULSE Wafer Level Reliability

Optical Chip Test
Laser Diode Test Laser Diode Burn-in Silicon Photonics

Power Semiconductor Test
Wafer Level Burn-In Known Good Die Visual Inspection and Sorting
Solutions
Solutions
Data center Telecommunication network Green energy Semiconductor Silicon Photonics Metaverse
Support
Support
Service FAQ
News
News
Company News Exhibition Information
About
About
Company Profile History Social Responsibility Culture Honor Compliance Statement

Join Us Talent recruitment
Contact
Contact
Contact Information Message

Please enter search keywords！

Site Map

Home > Products > Optical Chip Test > Laser Diode Test >

Laser Diode Test

Semiconductor lasers have the excellent characteristics of ultra-small, high-efficiency and high-speed operation, is the core devices of optical communication. Semiconductor lasers must be tested before leaving the factory, including before and after the burn-in of the product characteristics must be strictly controlled, in order to ensure the reliability and longevity.