Laser Diode Test
CT6206
High Power Laser Test System
CT6206 and BI6206 high-power laser BI systems share a test fixture board for automatic fixture loading and unloading, and support batch test and parallel test. It provides a very efficient platform for the mass production of high-power semiconductor lasers.
Feature
Good compatibility
Share a test fixture with BI6206 high power laser BI system;High test efficiency
Support batch input and output;Good repeatability
High repeatability of optical measurement;Support industrial low temperature
Low temperature - 40℃ test optional;Functions and advantages
System functions and advantages
4 test seat in parallel increases test efficiencySystem parameter | Chip type | All high power COC / COS lasers |
Fixture type | Compatible with BI6206 BI system fixture | |
Fixture loading and unloading | Automatic fixture loading and unloading | |
Fixture ID scanning identification | Automatic fixture Barcode scanning recognition | |
Parallel testing | COC fixture double side parallel test | |
Standard sample control | The software supports the standard sample control function. If the standard sample is tested on this machine for more than a time period (configurable), the system will automatically alarm | |
Test machine control | The software supports the control function of the test machine. If the same fixture is tested on different test machines before and after aging, the software will automatically generate an alarm prompt. | |
Test configuration control | The software supports test configuration management and control, including test instrument, test algorithm, test sequence, test result judgment, etc. | |
Test data | Support all test data required by users / support MES related requirements | |
Electrical | SMU type | Precision source meter |
Direct current | 3A | |
I / V source resolution | 500nA/100mV | |
I/V Measurement resolution | 500nA/100mV | |
Voltage range | 70V | |
Pulse current | 10A | |
EOS | No EOS (under any normal operation and use conditions) | |
Optical | Type of optical power measurement detector | InGaAs |
Optical power wavelength range | 1200-1700nm(expandable to 700 ~ 1700nm) | |
Optical power measurement range | 5mW-5000W | |
Optical power measurement accuracy | <0.2dB | |
Optical spectrum measurement range | Integrated Yokogawa AQ6360 or other spectrometers | |
Optical spectrum measurement accuracy | ||
Optical power coupling efficiency | Coupling power > - 15dBm | |
Temperature | Temperature control method | TEC+Water cooling system |
Temperature area | 4 independent temperature control areas | |
Temperature range | 25-100℃ | |
Temperature change speed (heating / cooling) | 8℃/min | |
Temperature resolution | 0.1℃ | |
Temperature accuracy | <±0.5℃ | |
Temperature consistency | <±0.5℃ | |
Temperature stability | <±0.1℃ | |
Test parameters | Ith Repeatability | ±1% |
Power repeatability | ±2% | |
SE Repeatability | ±2% | |
VF Repeatability | ±3% | |
Wavelength repeatability | <±0.1nm | |
SMSR Repeatability | <2.5dB |
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