CT6206 High Power Laser Test System-Semight Instruments

Laser Diode Test

CT6206

High Power Laser Test System

Semight Instruments High Power Laser Test System CT6206 supports the continuous or pulse mode with a current range of 10A. CT6206 is a very flexible test platform that supports CoC, CoS, CoB or TO packages, covering optical communications, industry, 3D sensors, laser radar and other applications.

CT6206 and BI6206 high-power laser BI systems share a test fixture board for automatic fixture loading and unloading, and support batch test and parallel test. It provides a very efficient platform for the mass production of high-power semiconductor lasers.

Datasheet

Apply for prototype

Feature

Good compatibility
Share a test fixture with BI6206 high power laser BI system;
High test efficiency
Support batch input and output;
four test platforms for parallel testing;
Good repeatability
High repeatability of optical measurement;
High wavelength measurement repeatability;
Supporting near-field and far-field test optional;
Support industrial low temperature
Low temperature - 40℃ test optional;

Functions and advantages

System functions and advantages
4 test seat in parallel increases test efficiency
Suitable for ocean optical spectrometer, which can test visible light wavelength
Single fixture temperature control, good repeatability of test data

System parameter	Chip type	All high power COC / COS lasers
	Fixture type	Compatible with BI6206 BI system fixture
	Fixture loading and unloading	Automatic fixture loading and unloading
	Fixture ID scanning identification	Automatic fixture Barcode scanning recognition
	Parallel testing	COC fixture double side parallel test
	Standard sample control	The software supports the standard sample control function. If the standard sample is tested on this machine for more than a time period (configurable), the system will automatically alarm
	Test machine control	The software supports the control function of the test machine. If the same fixture is tested on different test machines before and after aging, the software will automatically generate an alarm prompt.
	Test configuration control	The software supports test configuration management and control, including test instrument, test algorithm, test sequence, test result judgment, etc.
	Test data	Support all test data required by users / support MES related requirements
Electrical	SMU type	Precision source meter
	Direct current	3A
	I / V source resolution	500nA/100mV
	I/V Measurement resolution	500nA/100mV
	Voltage range	70V
	Pulse current	10A
	EOS	No EOS (under any normal operation and use conditions)
Optical	Type of optical power measurement detector	InGaAs
	Optical power wavelength range	1200-1700nm(expandable to 700 ~ 1700nm)
	Optical power measurement range	5mW-5000W
	Optical power measurement accuracy	<0.2dB
	Optical spectrum measurement range	Integrated Yokogawa AQ6360 or other spectrometers
	Optical spectrum measurement accuracy	Integrated Yokogawa AQ6360 or other spectrometers
	Optical power coupling efficiency	Coupling power > - 15dBm
Temperature	Temperature control method	TEC+Water cooling system
	Temperature area	4 independent temperature control areas
	Temperature range	25-100℃
	Temperature change speed (heating / cooling)	8℃/min
	Temperature resolution	0.1℃
	Temperature accuracy	<±0.5℃
	Temperature consistency	<±0.5℃
	Temperature stability	<±0.1℃
Test parameters	Ith Repeatability	±1%
	Power repeatability	±2%
	SE Repeatability	±2%
	VF Repeatability	±3%
	Wavelength repeatability	<±0.1nm
	SMSR Repeatability	<2.5dB

Similar recommendation

Optical Network Test

Optical communication network plays an important role in the rapid development of big data, cloud computing, 5G communication and other markets.
Semight Instruments offers various of instruments for optical Transceiver/Component testing, including wide bandwidth sampling oscilloscope, NRZ/PAM4 bit error ratio tester , burst error ratio tester, fast wavelength meter, optical spectrum analyzer, high precise source measure unit, 400G network analyzer ,optical power meter, optical attenuator, optical switch etc. Provide cost-effective complete solutions.

Details

Electrical Performance Test

The high-precision source meter integrates the functions of voltage source, current source, voltmeter, ampere meter, and electronic load in one, which is widely used in high-precision IV test and measurement for various discrete components, photovoltaic, new energy, battery and other industries. Semight Instrument provides high-precision benchtop source meters and plug-in PXIe source meter modules of standard PXIe chassis, fully meeting the application of various test scenarios.

Details

Optical Chip Test

Burn-in testing of laser is an important method to ensure the reliability of laser. Through the test of COC or bare die, the early failure of laser caused by the defects in the process of laser production can be screened out in advance. Semight Instrument provides a complete solution from bare die to COC, from high temperature(150℃ or higher) to low temperature (-40℃), with CoC automatic loading and unloading system, forming a complete test solution, Semight Instrument's laser chip burn-in/load/unload test system has been widely recognized by the market.

Details

Power Chip Test

The semiconductor front-end test is mainly used in the wafer processing to check whether the processing parameters of the wafer products meet the design requirements or there are defects affecting the yield after each step of the manufacturing process. The semiconductor back-end test equipment is mainly used after wafer processing to check whether the performance of the chip meets the requirements, which belongs to the electrical performance test. Semight Instrument provide integrated solutions such as wafer burn in and known good die tester, improve test efficiency and reduce test cost.

Details

Site Map