Laser Diode Test
CT6206
High Power Laser Test System
CT6206 and BI6206 high-power laser BI systems share a test fixture board for automatic fixture loading and unloading, and support batch test and parallel test. It provides a very efficient platform for the mass production of high-power semiconductor lasers.
Feature
Good compatibility
Share a test fixture with BI6206 high power laser BI system;High test efficiency
Support batch input and output;Good repeatability
High repeatability of optical measurement;Support industrial low temperature
Low temperature - 40℃ test optional;Functions and advantages
System functions and advantages
4 test seat in parallel increases test efficiencySystem parameter | Chip type | All high power COC / COS lasers |
Fixture type | Compatible with BI6206 BI system fixture | |
Fixture loading and unloading | Automatic fixture loading and unloading | |
Fixture ID scanning identification | Automatic fixture Barcode scanning recognition | |
Parallel testing | COC fixture double side parallel test | |
Standard sample control | The software supports the standard sample control function. If the standard sample is tested on this machine for more than a time period (configurable), the system will automatically alarm | |
Test machine control | The software supports the control function of the test machine. If the same fixture is tested on different test machines before and after burn-in, the software will automatically generate an alarm prompt. | |
Test configuration control | The software supports test configuration management and control, including test instrument, test algorithm, test sequence, test result judgment, etc. | |
Test data | Support all test data required by users / support MES related requirements | |
Electrical | SMU type | Precision source meter |
Direct current | 3A | |
I / V source resolution | 500nA/100mV | |
I/V Measurement resolution | 500nA/100mV | |
Voltage range | 70V | |
Pulse current | 10A | |
EOS | No EOS (under any normal operation and use conditions) | |
Optical | Type of optical power measurement detector | InGaAs |
Optical power wavelength range | 1200-1700nm(expandable to 700 ~ 1700nm) | |
Optical power measurement range | 5mW-5000W | |
Optical power measurement accuracy | <0.2dB | |
Optical spectrum measurement range | Integrated Yokogawa AQ6360 or other spectrometers | |
Optical spectrum measurement accuracy | ||
Optical power coupling efficiency | Coupling power > - 15dBm | |
Temperature | Temperature control method | TEC+Water cooling system |
Temperature area | 4 independent temperature control areas | |
Temperature range | 25-100℃ | |
Temperature change speed (heating / cooling) | 8℃/min | |
Temperature resolution | 0.1℃ | |
Temperature accuracy | <±0.5℃ | |
Temperature consistency | <±0.5℃ | |
Temperature stability | <±0.1℃ | |
Test parameters | Ith Repeatability | ±1% |
Power repeatability | ±2% | |
SE Repeatability | ±2% | |
VF Repeatability | ±3% | |
Wavelength repeatability | <±0.1nm | |
SMSR Repeatability | <2.5dB |
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