Power Chip Test-Semight Instruments

Power Chip Test

The semiconductor front-end test is mainly used in the wafer processing to check whether the processing parameters of the wafer products meet the design requirements or there are defects affecting the yield after each step of the manufacturing process. The semiconductor back-end test equipment is mainly used after wafer processing to check whether the performance of the chip meets the requirements, which belongs to the electrical performance test. Semight Instrument provide integrated solutions such as wafer burn in and known good die tester, improve test efficiency and reduce test cost.

Model

Name
WLBI3800

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Wafer-level full-automatic burn-in all-in-one machine

This system is designed to perform HTGB and HTRB burn-in of three wafers at a time, with automatic wafer loading and unloading,and is compatible with 2-3-4-6- and 8-inch SiC wafers
WLR3500

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HV SiC Wafer burn-in System WLR3500

WLR3500 wafer burn-in test system is suitable for product reliability screening and mass production quality monitoring
Support aging of SiC and GaN wafer products, gate ±75V, source 2000V
Support Idss, Igss, Vth parameter test
WLBI370A

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Wafer Burn-In Testing System WLBI370A

This syetem supports the burn-in of SiC wafer products, can carry out a single HTGB burn-in of 20 wafers at a time, automatic loading and unloading
WLBI3700

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HTGB Wafer Burn-In System WLBI3700

This syetem supports SiC, GaN wafer product burn-in, supports parametric testing Igss, Vth. and HTGB burn-in of up to 1500 products per wafer at the same time.
AL3500A

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Wafer Auto Load/Unload System AL3500A

AL3500A is an automated auxiliary equipment for Wafer level burn-in system WLR3500, assist the operator to complete the wafer alignment and fixture automatic installation.
PB6400

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KGD Test System PB6400

PB6400 KGD test system can be mainly used for power chip Die-level dynamic and static test to implement the screening of chip performance indicators and improve the first pass yield of the module after packaging.
AL6200

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Die Inspection Sorting System AL6200

AL6200 is mainly used in power chip die level visual inspection and sorting

mailbox

sales@semight.com
Service hotline

0512-68784483
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