CT6201-DC CoC Test System-Semight Instruments

Laser Diode Test

CT6201-DC

CoC Test System

CT6201-DC is a fully automatic CoC/CoS test system. Cost effectiveness and high efficiency make it a perfect solution for CoC/CoS mass production application. It uses the same fixture as Semight BI6201 CoC/CoS burn-in system, this reduced the DUT load/unloading process to greatly eliminate EOS/ESD damage.

Special designed optical power coupling system make the optical coupling and spectrum testing very fast with excellent repeatability.

CT6201-DC have two test seats in system, they could work independently and in parallel, also could set test temperature differently and independently.

Datasheet

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Feature

Large temperature range and high stability
Large temperature control range：25-100 ℃
High temperature stability：<±0.1 ℃
High test efficiency
Dual test platform, supporting dual side parallel test
Automatic up and down fixture, reducing the complexity and error probability of human participation
Extremely high test speed: each CoC test time is 7s
High repeatability
Threshold current repeatability：<±0.5%
Power repeatability：<±1%
Wavelength repeatability：<±0.05 nm
SMSR Wavelength <5 dB
High scalability
Support DC or pulse power to drive the laser；
Integrated Semight instrument precision source table；

System parameter	Chip Type	CoC/CoS
	Fixture Type	Support the same fixture of CoC BI system
	Fixture Type	Standard 48 pcs chip clamp (can be customized)
	Upper and lower clamps	Automatic upper and lower clamps
	Fixture ID Scan	Automatic Fixture Barcode scanning
	Parallel Testing	CoC fixture double side parallel test
	Standard sample control	The software supports the standard sample control function. If the standard sample is tested on this machine for more than a time period (configurable), the system will automatically alarm
	Test machine control	The software supports the control function of the test machine. If the same fixture is tested on different test machines before and after aging, the software will automatically generate an alarm prompt.
	Test configuration control	The software supports test configuration management and control, including test instrument, test algorithm, test sequence, test result judgment, etc.
	Test Data	Support all test data required by users / support MES related requirements
Electrical index	SMU Type	Standard Source/Measurement Unit
	DC Current	3 A
	I/V Source resolution	10 fA/100 nV
	I/V Measurement resolution	10 fA/100 nV
	Voltage Range	70 V
	Pulse Current	10 A
	EOS	No EOS (under any normal operation and use conditions)
Optical index	Optical Power measurement Detector Type	Ge
	Optical power wavelength range	800-1700 nm
	Optical power measurement range	10 μW-300 mW (Add attenuator if power by than 25 mW)
	Optical power measurement accuracy	<0.2 dB
	Spectral measurement range	Integrated Yokogawa AQ6360 or other spectrometers
	Spectral measurement accuracy	Integrated Yokogawa AQ6360 or other spectrometers
	Optical power coupling efficiency	Coupled Power >-15dBm for all cased need to test optical spectrum
Temperature control index	Temperature control method	TEC
	Temperature Zone	2 independent temperature control zones (dual stage）
	Temperature range	25-100 ℃
	Temperature change speed (heating / cooling)	20 ℃/min
	Temperature Resolution	0.01℃
	Temperature Accuracy	25~100 ℃:±0.5 ℃+1%ΔT
	Temperature Consistency	<±0.5℃
	Temperature stability	<±0.2℃
Test parameters	Ith Repeatability	±0.5%
	Power Repeatability	±1%
	SE Repeatability	±2%
	Wavelength Repeatability	<±0.15 nm；
	SMSR Wavelength	<5 dB

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