Laser Diode Test
TO6200
Industrial Low Temperature Test system
Feature
Industrial grade temperature range
-40℃~90℃;Good repeatability
Ith repeatability:<2% @high temperature, <3% @room temperature, <5% @low temperatureRich software functions
Support automatic judgment and classification of test results;High test efficiency
Each test fixture supports 160pcs TO-CAN, supporting 2 test fixtures in total for serial testing.Functions and advantages
Each fixture can set different temperatures at the same time
Internal fixtures and structuresRich software functions and simple operation
System index | DUT Type |
All TO-can packaged devices |
Fixture type | 160pcs TO-CAN fixture | |
Standard sample control | The software supports the standard sample control function. If the standard sample is tested on this machine for more than a time period (configurable), the system will automatically alarm | |
Test configuration control | The software supports test configuration management and control, including test instrument, test algorithm, test sequence, test result judgment, etc. | |
Test data | Support all test data required by users / support MES related requirements | |
Electrical index | SMU type | Semight Standard Source/Measurement Unit |
Direct current | 1A | |
I / V source resolution | 500nA/100mV |
|
I / V measurement resolution | 500nA/100mV |
|
Voltage range | 10V | |
Voltage source/voltmeter accuracy |
±(10V/60V), 0.02%+0.01% F.S |
|
EOS | No EOS under any normal operating conditions | |
Optical index | Type of optical power measurement detector | InGaAs |
Optical power measurement wavelength range |
1000-1650nm | |
Optical power measurement range |
10uW-45mW | |
Optical power measurement accuracy | 0.2dB | |
Spectral measurement range | Spectrometer provided by the customer |
|
Spectral measurement accuracy | ||
Optical power coupling efficiency | Coupling power > - 25dbm @ spectral measurement | |
Temperature | Temperature control method | TEC+Water chiller |
Temperature range | -40-90℃ | |
Ramp up speed | 25℃ ~ 85℃<12min |
|
Ramp down speed | 25℃ ~ -40℃<30min |
|
Temperature accuracy | <1℃ | |
Temperature uniformity (5-point range of fixture) |
High-temperature <±3℃ Low temperature <±2℃ |
|
Temperature stability | <0.4℃ | |
Ith Repeatability | <2% @high temperature, <3% @room temperature, <5% @low temperature |
|
Test parameters | Power repeatability | ±0.2mW |
SE Repeatability | <2% | |
Coupling power |
>-25dBm(Ith+30) |
|
Wavelength repeatability | <±0.1nm | |
SMSR Repeatability | <±3dB |
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