Wafer Acceptance Test
WAT6600
Parallel Parametric Test System
WAT6600 is a high efficiency parallel parametric test system that can quickly perform accurate DC measurements, capacitance measurements, and other high-frequency applications (such as ring oscillator measurements), flash memory tests and so on.
Features
Self-developed
Self-developed hardware and measurement resourcesHigh output capability
Perpin resource providingConfigurable Pin number
Maximum 48 Pin full kelvinHigh precision
The accuracy down to 1pA,SECS/GEM compliance
Easy integration to customer EAP or factory automationBuilt-in Maintenance software
CAL/DIAG/PVCompatible with 48pin
48pin 230mm-diamter probe cardCompatible with mainstream probers
TEL P8XL/P12/P12XL/Precio XL, TSK UF200/UF3000/UF3000EX, etc.
# |
Category |
Sub-Category |
Description |
1 |
System Cabinet |
Cabinet |
Rack, EMO Power Supply and Distribution Unit |
Controller |
Win10 Workstation, ptSEMIGHT software suites |
||
LCR |
Optional 1fF~100nF range Frequency:1KHz~1MHz |
||
DMM |
Optional 7 ½ display resolution |
||
Signal Analyzer |
Optional 9K~10M frequency range |
||
PXIe Chassis |
Optional For external HV-SPGU |
||
Semiconductor Pulse Generator |
Optional(S3023P) ±40V(Open), ±20V(50Ω)
|
||
2 |
Test Head |
Mainframe |
Configurable pins |
Pin Board |
Semight S2018G: Per-pin SMU: ±200V, ±1A, 100nV/1fA Per-pin PGU: ±20V(Open), ±10V(50Ω) |
||
Aux port |
Default configuration: 8 BCN Port for external Instrument |
Application |
|
Inline E-test, BEOL WAT, WLR for advanced process |
|
Test Items (typical) |
|
IV/CV |
Id-Vd,Id-Vg,Vth,BV,Ig,Ioff,Gm |
MIM_CAP,C & G |
|
Ic-Vc,BETA,BV |
|
Ron,R_tlm,Rsh_van |
|
Spot,Sweep,Search |
|
Kelvin & Non-Kelvin |
|
Differential Voltage |
|
Frequency |
Ring Oscillator Frequency |
Reliability |
HCI,NBTI/PBTI,TDDB, etc. |
DC |
|
Resource |
Semight Per-pin SMU S2018G |
Function |
Spot, Sweep |
|
S2018G: 1fA to 1A, 100nV to 200V |
Capacitance |
|
Resource |
External LCR |
Function |
C/G |
Frequency |
1kHz, 10kHz, 100kHz, 1MHz |
Range |
1fF to 100nF |
DC Bias |
±40 V |
Differential Voltage |
|
Resource |
External DMM |
Range |
1µV to 100V |
Pulse Generation |
|
Resource |
Semight Per-pin PGU S2018G |
Amplitude |
±20V (Open), ±10V(50Ω) |
Frequency |
0.1Hz to 5MHz |
Pulse Width |
100ns to (Period - 100ns) |
Tr/Tf |
<100ns (Typ 50ns) |
Frequency Measurement |
|
Resource |
External Signal Analyzer |
Frequency Range |
9K to 20M Hz |
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