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Wafer Acceptance Test

WAT6600

Parallel Parametric Test System


WAT6600 is a high efficiency parallel parametric test system that can quickly perform accurate DC measurements, capacitance measurements, and other high-frequency applications (such as ring oscillator measurements), flash memory tests and so on.


Features

  • Self-developed

    Self-developed hardware and measurement resources
    Stable supply chain, short lead time
  • High output capability

    Perpin resource providing
    SMU:200V max 1A max, PGU:±20V
  • Configurable Pin number

    Maximum 48 Pin full kelvin
  • High precision

    The accuracy down to 1pA,
    system leakage current <500fA,
    Extremely low current measurement
  • SECS/GEM compliance

    Easy integration to customer EAP or factory automation
  • Built-in Maintenance software

    CAL/DIAG/PV
    Fast troubleshooting and diagnostic of hardware problem, timely guarantee of tester performance
  • Compatible with 48pin

    48pin 230mm-diamter probe card
    Protect customer investment on probe card, low migration cost to new tester
  • Compatible with mainstream probers

    TEL P8XL/P12/P12XL/Precio XL, TSK UF200/UF3000/UF3000EX, etc.

System Configuration

#

Category

Sub-Category

Description

1

System Cabinet

Cabinet

Rack, EMO

Power Supply and Distribution Unit

Controller

Win10 Workstation,

ptSEMIGHT software suites

LCR

Optional

1fF~100nF range

Frequency:1KHz~1MHz

DMM

Optional

7 ½ display resolution

Signal Analyzer

Optional

9K~10M frequency range

PXIe Chassis

Optional

For external HV-SPGU

Semiconductor Pulse Generator

 

Optional(S3023P)

±40V(Open), ±20V(50Ω)

 

2

Test Head

Mainframe

Configurable pins

Pin Board

Semight S2018G:

Per-pin SMU: ±200V, ±1A, 100nV/1fA

Per-pin PGU: ±20V(Open), ±10V(50Ω)

Aux port

Default configuration:

8 BCN Port for external Instrument


System Functionality

Application

Inline E-test, BEOL WAT, WLR for advanced process

Test Items (typical)

IV/CV

Id-Vd,Id-Vg,Vth,BV,Ig,Ioff,Gm

MIM_CAP,C & G

Ic-Vc,BETA,BV

Ron,R_tlm,Rsh_van

Spot,Sweep,Search

Kelvin & Non-Kelvin

Differential Voltage

Frequency

Ring Oscillator Frequency

Reliability

HCI,NBTI/PBTI,TDDB, etc.

DC

Resource

Semight Per-pin SMU S2018G

Function

Spot, Sweep

 

S2018G: 1fA to 1A, 100nV to 200V

Capacitance

Resource

External LCR

Function

C/G

Frequency

1kHz, 10kHz, 100kHz, 1MHz

Range

1fF to 100nF

DC Bias

±40 V

Differential Voltage

Resource

External DMM

Range

1µV to 100V

Pulse Generation

Resource

Semight Per-pin PGU S2018G

Amplitude

±20V (Open), ±10V(50Ω)

Frequency

0.1Hz to 5MHz

Pulse Width

100ns to (Period - 100ns)

Tr/Tf

<100ns (Typ 50ns)

Frequency Measurement

Resource

External Signal Analyzer

Frequency Range

9K to 20M Hz

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Details
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