News-Company News-Semight Instruments

Semight in the spotlight at the show

2024.06.17

As the world's largest electronics and power supply chain event, PCIM Europe has a strong influence in the industry, and the exhibitions, technical forums, academic conferences,

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Semight presents the latest SiC KGD Test System at PCIM Europe

2024.05.29

Semight Insturments will showcase the latest semiconductor equipments including SiC KGD PB6600 test system, WLBI3800 Wafer-Level Burn-In system and WAT6300 High-Voltage Serial Parameter test system during the exhibition! Welcome！

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Welcome| Semight presents the latest semiconductor test systems at SEMICON SEA!

2024.05.17

Semight is going to showcase the latest SiC KGD test system PB6600, Wafer-Level Burn-In system WLBI3800, High-Voltage Serial Parameter Test System WAT6300 during the event.

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Semight Invited to Present at the 3rd International Forum on Compound Semiconductors in Taiwan

2024.04.30

On 25th April, the 3rd International Forum on Compound Semiconductors, jointly organised by the Taiwan Electronic Equipment Association (TEEA) and the College of Engineering of National Taiwan University (NTU), came to a successful conclusion at the Nanga

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Welcome |In April, we are in Fuzhou, Xi'an, Suzhou and Chengdu!

2024.04.14

In April, Semight will showcase a variety of precision instruments to Fuzhou, Xi'an, Suzhou and Chengdu, welcome to dropby us！

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Welcome|Semight will attend OFC2024 with optical network testing solutions

2024.03.25

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Welcome|Semight presents 3500V High Voltage SMU at SEMICON Shanghai!

2024.03.15

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New！ Semigt Instruments releases S2021H, 4-Channel High Precision Source Meter

2024.03.02

Semigt Instruments releases the 4-Channel High Precision Benchtop Source Meter S2021H

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New Breakthroughs | Semight Introduces 1fA/100nV High-Resolution Benchtop Source Meter S2036H

2024.01.28

With a resolution of 1fA/100nV and a measurement accuracy of 1pA, the S2036H Dual-Channel High-precision Benchtop Source Meter from Semight is widely used for high-precision measurements of leakage current, dark current and other small current

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