Semight PXIe source measure unit (SMU) integrates high-precision source and measure units, and can use PXIe source measure unit to build a high-density parallel test system to meet the high channel density of large-scale semiconductor integrated circuits and increase configuration flexibility. Maximize test efficiency and reduce test cost.

Semight PXIe SMU is based on advanced digital control technology, and the integrated Adaptive PFC (Precision- Fast Control) system enables users to adjust relevant parameters according to load characteristics to obtain accurate and fast output characteristics, even under high capacitive load conditions , also minimizes overshoot and ringing.

1 main feature

01 High voltage high precision measurement

S2013C supports 200V/1A DC/3A pulse, resolution 100fA/100nV, voltage accuracy 100μV, current accuracy 200pA

02 Adaptive PFC system

Users can use the Adaptive PFC (Precise-Fast Control) system, users can adjust relevant parameters according to the load characteristics to obtain more accurate and fast output characteristics

03 high speed measurement

S2013C can support up to 1M sampling rate, NPLC and sampling rate can be set according to needs to meet high-speed and high-precision measurement scenarios

2 Adaptive PFC system

The SMU uses closed-loop feedback control to ensure that the output of the source is accurately applied to the load. In actual use, to obtain an ideal response to different loads, the output characteristics of the source meter need to be configurable. However, traditional SMUs use analog hardware to implement the control loop, and the load will directly affect the control loop used to adjust the output voltage or current. . Therefore, it is difficult for the traditional analog architecture to achieve fast speed without overshoot, and it is almost unrealistic to design a circuit that can provide the ideal response for different loads.

Semight PXIe source meter adopts digital control system and integrated Adaptive PFC (Precise-Fast Control) system, which can optimize the control cycle through software, so as to optimize the response to different loads. This technology can provide the best response time, shorten the test time, and eliminate the oscillation, improve the stability of the test .

Adjustment of output characteristics by digital closed-loop control

Output characteristics before adjustment Output characteristics after adjustment        

3 Application of PXIe Source Measure Unit in Wafer Test

After the wafer (Wafer) is manufactured, thousands of bare Dies are regularly distributed throughout the Wafer, and the pins of the chip are all exposed. The exposed chip is connected to the source test unit through the probe to perform various electrical performance tests. Characterization of parameters.

Semight PXIe source meter supports standard PXIe chassis, users can configure chassis with different slots according to needs, and install PXIe source meter in the chassis, so as to realize multi-channel parallel testing and improve test efficiency !

Application of S2012C in CP (Chip Probing) test

4 Semight Source Meter Series

Semight can provide desktop source meters (with host and touch screen) and PXIe plug-in source meters (support standard PXIe chassis), and users can choose flexibly according to their needs .