Semiconductor lasers are usually screened according to the changes of one or more key operating parameters measured before aging (Pre Burn In) and after aging (Post Burn In) to eliminate early failures and improve product reliability. These parameters usually include threshold current, output optical power under specific working conditions, current required to reach specific output optical power, slope efficiency, spectral characteristics, etc.
CoC test of Semight Instruments
The fully automatic CoC test system CT6201 of Semight Instrument shares a fixture with the aging system BI6201 of Semight Instrument, which reduces the loading and unloading process of the chip under test, and also eliminates the potential risk of EOS/ESD during the loading and unloading process and the introduction of poor appearance of CoC products.
The patented optical power coupling system design ensures the rapidity and repeatability of optical coupling and spectral measurement.
The unique dual test platform design allows each platform to independently control the temperature, saving the waiting time for temperature rise and fall. The testing efficiency is greatly improved by cooperating with the dual side parallel testing of the CoC fixture.
Product features and advantages
1 High test efficiency
Design of dual test platform
Each platform can be independently temperature controlled
Support bilateral parallel testing at the same time
Automatically compare the parameter changes before and after aging, and give judgment
2 Fast test speed
Test time of each CoC (DFB)<7s
Fast temperature rise and fall
3 Special fixture design
Upper and lower fixture design,
The upper and lower parts are not separated during aging test,
Avoid multiple crimping and improve power on rate
Fully automatic test, improve test efficiency,
Avoid external force damage caused by manual clamping
Test fixture and automatic loading and unloading system AL6201/
Common to aging system BI6201
No EOS generation
4 High precision Source meter unit of Semight Self research
I/V source resolution, 10fA/100nV
I/V measurement resolution, 10fA/100nV
Support DC or pulse power supply to drive laser
5 Patent design optical coupling system
Ensure the rapidity and repeatability of optical coupling and spectral measurement
6 High test repeatability
Repeatability of threshold current<± 0.5%;
Power repeatability<± 1%
Wavelength repeatability<± 0.05nm; SMSR repeatability<5dB
7 Scale application
Semight CoC Aging Test Solution
Semight Instruments provides a complete solution for CoC/CoS loading and unloading, testing and aging, adapting to different test temperature requirements, different sizes and different types of semiconductor lasers, greatly improving the test efficiency and reducing the test cost!
Service hotline
Follow
Name
Email verfication code
Phone
Password
Confirm Password
e-mail address
Email verification code
New Password
Confirm Password