Semiconductor lasers are usually screened according to the changes of one or more key operating parameters measured before aging (Pre Burn In) and after aging (Post Burn In) to eliminate early failures and improve product reliability. These parameters usually include threshold current, output optical power under specific working conditions, current required to reach specific output optical power, slope efficiency, spectral characteristics, etc.

CoC test of Semight Instruments

The fully automatic CoC test system CT6201 of Semight Instrument shares a fixture with the aging system BI6201 of Semight Instrument, which reduces the loading and unloading process of the chip under test, and also eliminates the potential risk of EOS/ESD during the loading and unloading process and the introduction of poor appearance of CoC products.

The patented optical power coupling system design ensures the rapidity and repeatability of optical coupling and spectral measurement.

The unique dual test platform design allows each platform to independently control the temperature, saving the waiting time for temperature rise and fall. The testing efficiency is greatly improved by cooperating with the dual side parallel testing of the CoC fixture.

Product features and advantages

1 High test efficiency

Design of dual test platform

Each platform can be independently temperature controlled

Support bilateral parallel testing at the same time

Automatically compare the parameter changes before and after aging, and give judgment

2 Fast test speed

Test time of each CoC (DFB)<7s

Fast temperature rise and fall

3 Special fixture design

Upper and lower fixture design,

The upper and lower parts are not separated during aging test,

Avoid multiple crimping and improve power on rate

Fully automatic test, improve test efficiency,

Avoid external force damage caused by manual clamping

Test fixture and automatic loading and unloading system AL6201/

Common to aging system BI6201

No EOS generation

4 High precision source table of Semight Self research

I/V source resolution, 10fA/100nV

I/V measurement resolution, 10fA/100nV

Support DC or pulse power supply to drive laser

5 Patent design optical coupling system

Ensure the rapidity and repeatability of optical coupling and spectral measurement

6 High test repeatability

Repeatability of threshold current<± 0.5%;

Power repeatability<± 1%

Wavelength repeatability<± 0.05nm; SMSR repeatability<5dB

7 Scale application

Semight CoC Aging Test Solution

Semight Instruments provides a complete solution for CoC/CoS loading and unloading, testing and aging, adapting to different test temperature requirements, different sizes and different types of semiconductor lasers, greatly improving the test efficiency and reducing the test cost!