WLR0100 Wafer Level Reliability Test System-Semight Instruments

Feature

Voltage range
0-200V software settable
Channel hardware independent current limiting
0-10mA software settable
Monitoring current sampling rate
Minimum 10nA accuracy
The polling of 32 products on a single board is completed in 1 second
Independent double temperature zone
Up to 200 ℃
Single board support channel
32 channels
Channel independent gear
It can meet the accuracy and range requirements, and the channel is independent
Product abnormal protection function
The equipment has overvoltage and overcurrent protection functions
Support nitrogen access protection

Functions and advantages

Burn-in Board for DIP Package
The supporting burn-in board adopts a gold finger structure. The following figure shows a typical DIP packaged of burn-in Board.
The WLR0100 test software platform is a configurable platform, including the following functions:
Support the in place pre inspection function of online products, which can detect whether the user has good plug and pull contact;
Support flexible editing and configuration of aging reliability tasks, and conduct reliability testing;
Provide intuitive data display and data analysis functions;
Support user authority control, including engineer, technician and operator.

Technical Parameter	DUT	DIP or TO247 Burn-in Board
Technical Parameter	Test temperature range	(RT+20)℃～+200℃
Electrical parameters	Test parameters	Storage of original test data, calculation results and detailed system operation logs
	Channel	Up to 384 ch
	Drive board	Independent 32 ch current and voltage monitoring
	System driver board	12 driving boards independently adjust voltage and current limiting
	Vth scanning test	Range：0V~200V ,Accuracy：0.5%RD±500mV;
	Saturation current test	≤10mA
	Leakage current range and accuracy	Range：1mA~10mA ,Accuracy：0.5%RD±50uA; Range：100uA-1mA ,Accuracy：0.5%RD±500nA; Range：10uA-100uA ,Accuracy：0.5%RD±50nA; Range：1uA-10uA ,Accuracy：0.5%RD±5nA; Range：0nA-1uA ,Accuracy：0.5%RD±500pA;
	Voltage range and accuracy	Range：0V~20V ,Accuracy：0.5%RD±50mV; Range：20V~200V ,Accuracy：0.5%RD±500mV;
	Data monitoring	Support the monitoring of voltage and current and upload them to PC client, detect and record the parameters of each test station during the whole test process, and draw the output curve and Excel data report
Temperature parameters	Test environmental conditions	When the ambient temperature is+25 ℃ and there is no sample in the test chamber and no air exchange
	Test method	GB/T 5170.2-2017 Temperature test equipment
	Temperature range	(ambient temperature+20)℃～+200℃
	Temperature fluctuation	≤100℃：0.4℃; ≤200℃：0.4℃
	Temperature deviation (no-load)	≤100℃：±1.5℃; ≤200℃：±2.0℃
	Temperature deviation (full load)	≤100℃：±2.0℃; ≤200℃：±3.0℃
Gas parameters	Fluid	N₂、CO₂ (Normal temperature, dry gas)
	Fluid pressure	Air source pressure requirements: ≥1MPa (10kg/cm²)（101、201、301 model）； ≥1.5MPa (15kg/cm²)（401 model） Maximum allowable pressure at valve inlet: 2.0kg/cm²（ 101、201、301 model）; 5.0kg/cm²（ 401 model）
	Flow	Maximum flow：30L/min（101、201、301 model）; 250 L /min（401 model）
	Air connection	10mmAir source interface requirements: quick plug pneumatic pipe straight, specification φ 10mm

Similar recommendation

Optical Network Test

Optical communication network plays an important role in the rapid development of big data, cloud computing, 5G communication and other markets.
Semight Instruments offers various of instruments for optical Transceiver/Component testing, including wide bandwidth sampling oscilloscope, NRZ/PAM4 bit error ratio tester , burst error ratio tester, fast wavelength meter, optical spectrum analyzer, high precise source measure unit, 400G network analyzer ,optical power meter, optical attenuator, optical switch etc. Provide cost-effective complete solutions.

Details

Electrical Performance Test

The high-precision source meter integrates the functions of voltage source, current source, voltmeter, ampere meter, and electronic load in one, which is widely used in high-precision IV test and measurement for various discrete components, photovoltaic, new energy, battery and other industries. Semight Instrument provides high-precision benchtop source meters and plug-in PXIe source meter modules of standard PXIe chassis, fully meeting the application of various test scenarios.

Details

Optical Chip Test

Burn-in testing of laser is an important method to ensure the reliability of laser. Through the test of COC or bare die, the early failure of laser caused by the defects in the process of laser production can be screened out in advance. Semight Instrument provides a complete solution from bare die to COC, from high temperature(150℃ or higher) to low temperature (-40℃), with CoC automatic loading and unloading system, forming a complete test solution, Semight Instrument's laser chip burn-in/load/unload test system has been widely recognized by the market.

Details

Power Chip Test

The semiconductor front-end test is mainly used in the wafer processing to check whether the processing parameters of the wafer products meet the design requirements or there are defects affecting the yield after each step of the manufacturing process. The semiconductor back-end test equipment is mainly used after wafer processing to check whether the performance of the chip meets the requirements, which belongs to the electrical performance test. Semight Instrument provide integrated solutions such as wafer burn in and known good die tester, improve test efficiency and reduce test cost.

Details

Site Map