Optical Test Instrument
AT430X
Single Mode Attenuator
AT430X series benchtop multi-channel attenuators are fiber optic instruments for optical transceiver and network integration test. High setting speed of attenuation and power as well as power measurement capability, combined with USB, and LAN interfaces provides increased throughput and operational efficiency to meet today's challenges both in R&D and manufacturing.
AT430X series attenuators feature both attenuation mode and power control mode. With integrated input and output monitor power-meter, it is the unique tool to combine both attenuator and power-meter in one box.
Features
Power Monitoring Function
Supports input and output power monitoring, monitor power range: +10~-50 dBm
Parallel Testing
Supports multi-channel parallel measurement to improve test efficiency
Power Lock
Supports decay mode and power control mode, automatically keep the output power constant in power control mode
User-friendly Interface
Easy-to-use and intuitive graphical user interfaceAT4301/2/4/8 |
|
| Connector Type | FC/UPC or FC/APC |
| Fiber Type | 9/125 μm |
| Wavelength | 1250~1650 nm |
| Calibrated Wavelength | 1270/1290/1310/1330/1490/1550 nm |
| Attenuation Range | 0~40 dB |
| Resolution | 0.1 dB |
| Accuracy | ±0.2 dB |
| Repeatability | <0.1 dB |
| Insertion Loss | ≤1.2 dB |
| Power Monitor Range | +10~-50 dBm |
| Power-meter Accuracy | 3% |
| Return Loss | Typ. 45 dB |
| Maximum Safe Input Power | +23 dBm |
| Display | Default 3.5-inch TFT |
| Remote Control | LAN, USB |
| Channel Number | 1, 2, 4 or 8 |
Similar recommendation
High speed communication test plays an important role in the rapid development of big data, cloud computing, 5G communication and other markets.
Semight offers various of instruments for optical Transceiver/Component testing, including wide bandwidth sampling oscilloscope, NRZ/PAM4 bit error ratio tester , burst error ratio tester, fast wavelength meter, optical spectrum analyzer, high precise source measure unit, 400G network analyzer ,optical power meter, optical attenuator, optical switch etc. We provide cost-effective, complete solutions for optical testing.
The high-precision source measure units integrates the functions of voltage source, current source, voltmeter, ampere meter, and electronic load in one, which is widely used in high-precision IV test and measurement for various discrete components, photovoltaic, green energy, battery and other industries. Semight provides high-precision benchtop SMU and plug-in PXIe SMU of standard PXIe chassis, fully meeting the application of various test scenarios.
Details
Burn-in testing of laser is an important method to ensure the reliability of laser. Through the test of CoC or bare die, the early failure of laser caused by the defects in the process of laser production can be screened out in advance. Semight provides a complete solution from bare die to CoC, from high temperature(150℃ or higher) to low temperature (-40℃), with CoC automatic loading and unloading system, forming a complete test solution, Semight's laser chip burn-in/load/unload test system has been widely recognized by the market.
Details
The semiconductor front-end test is mainly used in the wafer processing to check whether the processing parameters of the wafer products meet the design requirements or there are defects affecting the yield after each step of the manufacturing process. The semiconductor back-end test equipment is mainly used after wafer processing to check whether the performance of the chip meets the requirements, which belongs to the electrical performance test. Semight provides solutions such as Wafer Level Burn In system and Known Good Die handler for SiC testing, offering the value to customer in test efficiency improvement and test cost reduction.
DetailsFollow
Name
E-mail verfication code
Phone
Password
Confirm Password
E-mail address
E-mail verification code
New Password
Confirm Password
Datasheet
Ask for demo
