Please enter search keywords!

Site Map

Site Map

Network Tester

NTA4100

400G Network Tester


Semight NTA4100 is specifically designed for high speed ethernet traffic test, which supports not just 400GE, but also other speeds as 200GE and 100GE. It can be used to handle comprehensive KP4 forward error correction (FEC) testing and statistics, FEC symbol error injection testing, L1 BERT and the L2 performance testing.



Features

  • High Bandwidth

    High bandwidth, high throughput, support rate up to 400Gbps
  • Standards compliant

    400G FEC function implementation fully compliant with Ethernet protocol
  • Full Ethernet Analysis Capabilities

    Provides 400G Ethernet MAC/PCS/PMA/PMD layer analysis functions to efficiently diagnose product problems
  • Support module protocol

    Support CMIS 4.0, provide loopback test function
    Support module MDIO read and write

Features and Benefits

  • PCS layer error test

  • FEC symbol error distribution test

    Ethernet Frame FEC Symbol Error Distribution
  • 2544 standard test

    2544 Basic test items:
    Throughput
    Back to back
    Drop frame
    Delay

NTA4100
Physical interface QSFP-DD; QSFP-28

Port speed

400GE, 200GE, 100GE
Ethernet interface protocol

IEEE 802.3bs 200GE & 400GE, 400GBASE-R

IEEE 802.3bm 100GE,100GBASE-R

FEC


KP4 RS(544,514)Ethernet Forward Error Correction, Clause 119

FEC margin analysis, FEC symbol error injection

Statistical analysis of FEC:

Total number of error bits, maximum number of symbol errors, number of corrected codewords, total number of codewords, number of uncorrected codewords, error ratio before FEC, bit codewords distribution analysis


Bit error ratio

Layer 1 Error, pre-FEC Error Ratio, post-FEC Error Ratio,Frame Loss

Minimum frame size 64 bytes

Maximum frame size

9416 bytes (Default: 9,000 bytes, configurable)

Pattern

Pseudo random sequence, PRBS31 expandable

Flow control

Traffic load 0%~100%

Error injection

FEC Symbol Error Injection and Analysis

Support sending Ethernet frames longer than the standard

Hardware cache

400GE: 1 MB; 200GE: 1 MB; 100GE: 1 MB

Optical module management interface


CMIS support with loopback testing

MDIO read/write, alarms/errors generation and monitoring


Similar recommendation

Optical Network Test
Optical Network Test

Optical communication network plays an important role in the rapid development of big data, cloud computing, 5G communication and other markets.
Semight offers various of instruments for optical Transceiver/Component testing, including wide bandwidth sampling oscilloscope, NRZ/PAM4 bit error ratio tester , burst error ratio tester, fast wavelength meter, optical spectrum analyzer, high precise source measure unit, 400G network analyzer ,optical power meter, optical attenuator, optical switch etc. Provide cost-effective complete solutions.

Details
Electronic Measurement
Electronic Measurement

The high-precision source meter integrates the functions of voltage source, current source, voltmeter, ampere meter, and electronic load in one, which is widely used in high-precision IV test and measurement for various discrete components, photovoltaic, new energy, battery and other industries. Semight Instrument provides high-precision benchtop source meters and plug-in PXIe source meter modules of standard PXIe chassis, fully meeting the application of various test scenarios.

Details
Optical Chip Test
Optical Chip Test

Burn-in testing of laser is an important method to ensure the reliability of laser. Through the test of COC or bare die, the early failure of laser caused by the defects in the process of laser production can be screened out in advance. Semight Instrument provides a complete solution from bare die to COC, from high temperature(150℃ or higher) to low temperature (-40℃), with CoC automatic loading and unloading system, forming a complete test solution, Semight Instrument's laser chip burn-in/load/unload test system has been widely recognized by the market.

Details
Power Semiconductor Test
Power Semiconductor Test

The semiconductor front-end test is mainly used in the wafer processing to check whether the processing parameters of the wafer products meet the design requirements or there are defects affecting the yield after each step of the manufacturing process. The semiconductor back-end test equipment is mainly used after wafer processing to check whether the performance of the chip meets the requirements, which belongs to the electrical performance test. Semight Instrument provide integrated solutions such as wafer burn in and known good die tester, improve test efficiency and reduce test cost.

Details
Log in

Account number

Password

Register an account

Name

Please enter your name *

Email

Please enter your email address *

Email verfication code

Please enter your email verification code

Phone

Please enter your contact number *

Password

Please enter your login password *

Confirm Password

Please enter your login password again *
Retrieve password

e-mail address

Please enter your email number *

Email verification code

Please enter your email verification code

New Password

Please enter your login password *

Confirm Password

Please enter your login password again *