The 24th China International Optoelectronics Expo will be held in Shenzhen International Convention and Exhibition Center (Security New Hall) on September 6-8, 2023, Semight Instruments will bring 400G/800G Test Head to participate, booth number :10A73, welcome to visit!

400G/800G optical module test solution

01 Discrete Test Solution

Maximum flexibility based on individual benchtop instrumentation including error meter, oscilloscope, clock recovery unit, etc

Discrete instrument 400G/800G FR4 test block diagram

02 Integrated Test Head

In addition to traditional discrete Test platforms, Semight Instruments also offers highly integrated test heads

· MTP4101/MTP4102/MTP4104, support 10Gbps~400Gbps optical module test

· MTP8102, support 800Gbps OSFP/QSFP-DD optical module test

Test Head features

The Test Head integrates a bit error analyzer (BERT), MCB test board, and TEC temperature cycle control system to test the bit error of high-speed optical modules at different temperatures

· Integrated MCB test card for flexible and fast DUT MCB replacement

· Integrated error meter platform eliminates additional cable connections, further reducing test bench space and cost

· Integrated TEC temperature control system, support module temperature cycle test

Test Head supports module type and number of parallel tests

800G Test Head 2xFR4 test block diagram

800G Test Head 2xFR4 test block diagram

03 Core instrument features and introduction

  1 DCA6201 sampling oscilloscope

    · A variety of the Filter optional, 27.95/28.05 25.78/26.56 / Gbps, 265625/28.9 Gbaud PAM4

    · Extended filter range via SIRC (12.44Gbaud-56Gbaud)

    · Support 53Gbaud PAM4(SIRC) eye map test

    · Supports 50GPON OLT TDEC(SIRC) tests

    · Support for NRZ and PAM4 testing

2 56G baud rate clock recovery unit

Semight Instruments CR6256 clock recovery unit supports NRZ/PAM4 signal clock extraction at 24.8832~32.5 Gbaud/49.7664 ~56Gbaud rate, which is widely used in single wave 53 Gbaud optical module and interface clock extraction

· Single-mode and multi-mode integrated, can support single-mode and multi-mode optical signal clock recovery

· High sensitivity

-12dBm @ 53.125 Gbaud PAM4

-14dBm @ 26.5625 Gbaud PAM4

· Low jitter, recovery clock random jitter typical value 290fs

3 800G error meter

Semight Instruments PBT8812 high-speed serial error meter supports 24.33~56.25 Gbaud symbol rate, fully covering 200/400/800Gbps optical module test scenarios

· Each channel can be configured independently to either NRZ or PAM4 signalling

· Support the receiving end of the electric eye histogram and signal to noise ratio measurement

· Supports pre-accentuated and de-accentuated modulation at the transmitter end in order 3 /7 mode

· Support real FEC generation and testing analysis