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Semight instruments: the first anniversary of the mass production of chip testing machines, and nearly 100 orders have been obtained
Date:2022.07.17 Visits:749
Since its launch,Semight Instruments chip testing machine has been recognized by many domestic customers and shipped in batches due to its advantages such as fast testing speed, high temperature control accuracy, stable and reliable reproducibility and correlation of test data, and accurate data. By February 2022, the total shipment has exceeded 60 sets, with nearly 40 orders in hand and nearly 100 orders obtained.




ICC news the independent semiconductor laser chips of China's optical communication industry have developed rapidly in recent years. Dozens of semiconductor laser chip production lines have been built, and the detection demand has reached the order of billions or even tens of billions.
Chip yield is one of the important factors affecting the cost of enterprises. Semiconductor lasers belong to compound semiconductors, and their main materials are very brittle gallium arsenide and indium phosphide. It is a common problem that the yield rate is not high in each process of its preparation. Take the well-known chip enterprises abroad as an example, their production can achieve a yield of more than 70%, but the post packaging and the strict judgment standards of the final products have accumulated a loss of 30% yield. The yield rate is not high, so special testing equipment is required to screen the defective products. The domestic bar bar bar test in this field has always been at the low end, because the chip after bar bar test needs secondary splitting, and various factors in the intermediate link will cause 3-5% yield loss for the demanding high-end chip. With the increasing speed of semiconductor laser chips, there is a trend of smaller chip size and more complicated process in the back channel packaging. However, these chips with secondary damage will flow into the back channel packaging as good products, which will bring huge cost expenditure and thus increase the production cost of finished devices. In addition, the semiconductor laser chip is very sensitive to temperature, and the contact of the bar bar on the test bench cannot fully meet the requirements of heat dissipation of the chip under high temperature test conditions, so the repeated test GRR cannot be guaranteed. Therefore, domestic and foreign manufacturers have gradually shifted from low-end bar bar bar test to high-end bare die semiconductor laser chip test.




In Chinese Mainland, such high-end testing equipment was almost monopolized by imports. In the context of the Sino US trade war, these imported equipment were banned or restricted from sale to 300 listed companies in China, hindering the development of China's independent optoelectronic chip industry.




In order to meet the new demands of the domestic market, based on its rich experience in the development of laser chip test technology and core test instruments, after years of dedicated research and development, independent innovation and iteration, lianxun instrument has made breakthroughs in many core technologies. In 2020, lianxun instrument took the lead in launching the domestic ct8201 prototype of semiconductor laser chip constant temperature test machine, breaking the foreign monopoly. Ct8201 was officially put into mass production in March 2021, followed by ct8203, a chip testing machine that meets the requirements of industrial low-temperature testing.




The laser chip testing machine of lianxun instrument is the key core high-end equipment of optical chip testing. It is a complex system integrating optical, mechanical, electrical, software and computing. Through the integrated chip ID scanning, loading, transportation, high / low temperature control, testing, unloading, sorting and sorting functional units, it can adapt to the detection of electrical and optical characteristics of different types of semiconductor lasers (DFB, EML, EML + SOA) bare die chips and COC chips Determination and sorting.




At the early stage of verification, the chip testing machine of lianxun instrument has passed the strict and high load verification of many domestic customers. It continuously tests 5000 chips without throwing materials. At the same time, it is benchmarked with imported equipment. All test performance indicators and production yield meet the requirements of customers, and even some indicators are better than imported equipment. Finally, it is unanimously recognized by customers.
Since its launch, lianxun instrument chip testing machine has been recognized by many domestic customers and shipped in batches due to its advantages such as fast testing speed, high temperature control accuracy, stable and reliable reproducibility and correlation of test data, and accurate data. By February 2022, the total shipment has exceeded 60 sets, with nearly 40 orders in hand and nearly 100 orders obtained




The main performance indicators of the chip tester are as follows:
Two specifications are provided for customers to choose: normal high temperature tester 25 ℃ ~ 95 ℃ (model ct8201), three temperature tester - 45 ℃ ~ 95 ℃ (ct8203);
The two types of testing machines are equipped with two temperature zones, and the chip can complete two temperature tests at the same time;
The test efficiency of a single chip is less than 5.5s (1 liv + 3 spectra + OCR), and different test conditions will be different;
Chip ID recognition rate > 99.5%;
Test repeatability:
Ith<±0.2mA(-40℃),<±0.2mA(25℃),< ±0.5mA(85℃);
Po<±2%;
Vf<±0.01V;
λ c<±0.1nm;
SMSR<±1.5dB;



Main features of chip testing machine:
Good compatibility: support DFB, EML and EML + SOA chip testing, only need to configure the corresponding channel source table;
Supports multiple chip sizes, and can customize the stage according to the chip size;
Support CW and pulse modes for liv and spectrum testing;
The self-developed test platform fully grasps the whole process from material, processing and surface treatment to ensure high thermal conductivity and high wear resistance of the platform;
Open software architecture, supporting expansion, facilitating customers to independently prepare production plans, test specifications and output production reports;
Senior automation design and test team, quickly respond to customer software, hardware and test customization requirements, and finally ensure the stability of the test;
At the same time, lianxun instrument takes advantage of its outstanding advantages in domestic high-end test instruments and equipment, and integrates the high-precision digital source meter of lianxun's own brand in the chip testing machine, with high accuracy and fast scanning speed, which greatly reduces the cost of ownership of customers.



Performance index of Semight high precision digital source meter series:
Single / double / four channel integrated four quadrant measurement function;
Large range: ± 3A (DC), ± 10A (pulse), ± 200V;
The minimum measurement resolution can reach 100fa / 100nv;
Single machine / multi machine high speed synchronization;
Pxie plug-in and desktop;
High speed measurement, up to 1m ADC sampling rate;
Lianxun instrument's high-precision digital source meter series products have won customers in the optical communication, led and semiconductor industries
The recognition of, and the growth of another domestic leading product line of lianxun instrument family will bring new impetus to the performance growth of lianxun.

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