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Semight instruments launched 400g flow meter and chip testing machine, and the 400g / 800g test scheme is more complete
Date:2022.07.17 Visits:1267

With the rapid development of the network, more and more applications need more frequency band support. In order to meet the expansion needs of the backbone network of operators, 400G will be the direction of backbone network upgrading and new construction. For Semight, our solution is to help customers create a more reliable, efficient and cost-effective network system. To this end, Semight launched a series of complete test systems including 400G flow meter, 400G / 800G bit error meter, 25G NRZ DCA & 28g CDR and laser chip tester.


Schematic diagram of 400G test solution

1. 400G flow meter NTA4100
key parameter
1. RS (514544) real-time coding and decoding
2. Port type: support 1 OSFP, 2 qsfpdd and 4 SFP 56 port types
3. The frame length of Ethernet is 60 ~ 16000 bytes, which can be configured, and the point-to-point Ethernet link is connected
4. Analysis method: FEC margin analysis, packet statistics, bit error analysis (port or each channel), statistical analysis of PCs channel, FEC bit error injection



Functional features
1. High bandwidth and high throughput, port rate up to 400Gbps
2. Realization of 400G FEC function fully conforming to Ethernet protocol
3. Provide analysis function of 400G Ethernet MAC / PCS / PMA / PMD layer to diagnose product problems efficiently
4. Rich optical module port types, supporting offset measurement between channels
5. Support module MDIO reading and writing


II. 400G / 800G bit error detector PBT8856 / PBT8812


key parameter
1. Up to 60Gbaud (120Gbps @ PAM4)
2. Output amplitude (difference): net output value under normal mode > 600mVpp
3. Rise and fall time < 10ps, jitter (RMS) < 650fs, sensitivity 100mVpp




Functional features
1. The service channel can support up to 8x112 Gbps
2. Each channel can be independently configured as NRZ or PAM4 signal system
3. Fast rising edge and low inherent jitter
4. Built in RF switch to realize software program-controlled switching trigger clock port
5. Support FEC analysis, including 800G FEC
6. Provide an integrated solution with temperature cycling Kit


III. 25G NRZ DCA   DCA6201
key parameter
1. Wavelength range: 750nm ~ 1650nm; RMS noise 15uw typical value (maximum: 18uw)
2. Sensitivity (minimum average power for template test) – 8 dBm
3. Time base interval accuracy: 1.5ps
4. Electrical channel bandwidth 30GHz (typical value), background noise < 1mV (typical value)



Functional features
1. Support optical / electric eye diagram test; Rate support 28Gbaud, 25Gbaud
2. Pattern lock function option; PAM4 signal test function option
3. Bandwidth up to 30GHz


IV. 28G/56G CDR CR6201



key parameter
1. Recovery clock random jitter (RMS) < 290fs, rate range: 20Gbaud ~ 28.9Gbaud
2. Support modulation type NRZ / PAM4, receiver sensitivity multi-mode - 5dBm, single-mode - 15dBm
3. Input optical signal power range < + 6dbm, input wavelength range 850nm / 1250 ~ 1650nm



Functional features
1. Support clock recovery function from NRZ and PAM4 signals, including adjustable loop bandwidth and optional peak, with high sensitivity and low inherent jitter performance
2. Strong EQ equalization ability, which can recover the clock from the closed eye pattern signal
3. Integrated clock recovery unit, photoelectric (O / E) converter and optical splitter
4. Support clock recovery of optical and electrical signals, and support single-mode and multi-mode


V. Laser chip tester


key parameter
1. Spectrum test wavelength range: 800 ~ 1650nm
2. Liv test adopts large-area PD with target size of 10 * 10mm, which supports front light and backlight test
3. Single chip test time < 6.5s
4. Chip ID recognition rate > 99%
5. High temperature test repeatability: threshold current ith < ± 1%, optical power Po < ± 2%, voltage VF < ± 0.02v, peak wavelength < ± 0.2nm, SMSR < ± 2dB


Functional features

1. The test bench adopts special substrate and processing technology to ensure high thermal conductivity and test life of the test bench (> 2 years)
2. Support DFB and EML laser testing
3. Support CW / pulse power up
4. Unique coupling technology to ensure the accuracy of spectral testing
5. Open test algorithm definition, intelligent data management system, and customer customization

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