Please enter search keywords!

Site Map

Site Map

Burst Error Ratio Tester

rBT2250

10G Burst Mode Bit Error Ratio Tester


rBT2250 is a burst bit error ratio tester to evaluate 10G/25G/50G OLT (Optical Line Terminal) receiver performance in burst mode. rBT2250 provides 2 independent pattern generator/error detector channels, and provide laser enable/ receiver reset /RSSI trigger signals and SD signal detect function. With Build-in burst clock data recovery, clock would be recovered from the burst data every time, it is a must in long fiber testing. The high integration multi-channel design of rBT2250 make it the best choice for burst bit error ratio analysis.

Features

  • Multi-rate

    Burst Rate:9.953/ 10.3125/12.4416/
    24.8832/ 25.78125 Gbps
  • Support Combo-PON test

    Dual reset signal, support Combo-PON test
  • SD Test

    Individual LOS monitoring/SD monitoring/LOS judgment for each channel
  • Built-in clock recovery

    It can work in a real long-fiber environment, avoiding the influence of long-fiber on delay and jitter

Features and Benefits


  • Upport burst test of Combo-PON,
    Double reset signal, the reset position is adjustable, Combo-pon must have 2 reset signals;
  • Double packet test

    Each data packet has different attenuation, there are transitions between the phases of different data packets, and there are long consecutive "1" and "0" in the data packet.
    Need to simulate the worst 2 ONU signal generation;
  • Built-in clock recovery, support long fiber test

    The built-in clock recovery enables the rBT2250 to work in a real long-fiber working environment, which is basically impossible in other solutions commonly used in the industry, because those systems do not support clock recovery and cannot adapt to the effects of long-fiber on delay and jitter.
Pattern Generator Specifications Output

Differential

AC coupling, 100 Ω Termination
Single End AC coupling, 50 Ω termination
Output Amplitude 300-600 mVp-p

Differential

Output Channel
2 in-depended Burst Channels

Burst/Continuous mode

1 Continuous Channel
(25G NRZ/50G NRZ)

Continuous mode
Pattern PRBS7,23,31,User Defined,CID pattern
Support data rate 9.953/10.3125/12.4416/24.8832/25.78125 Gbps
Rise Time <20 ps 20%~80%
Jitter <1 ps RMS
Pre-emphasis

Support Pre-Cursor & Post Cursor adjustment to minimize testing fixture or RF cable insertion loss

Pattern Sequence


Each Channel can be set preamble/payload/guard-time pattern sequence in-dependently


CID code type

Support add continuous “1”,continuous “0” pattern as length from 64-128 bits (adjustable)

connector type

2.92 mm female, 50 Ω

Clock/ Trigger and control channel Trigger output

Support Frame Trigger output

Clock Output

1/2、1/4、1/8、1/16 divided clock output

Laser Enable Channel

Support 2 laser enable control channel outputs( each enable control channel is synchronized with Pattern Generator channel)

Enable Output Level TTL level, support high/low enable and continuous High/Low

Reset Channel

Support 2 reset channel outputs (reset channel is synchronized with error detector channel)

Reset Width

Adjustable

Reset Position

Adjustable, support Auto-Range to find the right reset position

RSSI Trigger out

Support RSSI trigger (adjustable for RSSI trigger pulse width/repeat frequency and position)

Bit Error Detector Specifications Input type

Differential/Single end

Data Rate 9.953/10.3125/12.4416/24.8832/25.78125 Gbps
Impedance 100 Ω

Input Amplitude Range

100~800 mVp-p
Sensitivity >100 mV
Clock Mode

Internal burst clock data recovery unit

Synchronize

Auto-synchronization and Auto-range

Connector 2.92 mm female, 50 Ω


文档下载

名称
版本
发布时间
下载
  • rBT1250 X-PON突发信号误码测试仪-使用说明书
    V7.0
    2022-07-20
    点击下载

Similar recommendation

Optical Network Test
Optical Network Test

Optical communication network plays an important role in the rapid development of big data, cloud computing, 5G communication and other markets.
Semight Instruments offers various of instruments for optical Transceiver/Component testing, including wide bandwidth sampling oscilloscope, NRZ/PAM4 bit error ratio tester , burst error ratio tester, fast wavelength meter, optical spectrum analyzer, high precise source measure unit, 400G network analyzer ,optical power meter, optical attenuator, optical switch etc. Provide cost-effective complete solutions.

Details
Electrical Performance Test
Electrical Performance Test

The high-precision source meter integrates the functions of voltage source, current source, voltmeter, ampere meter, and electronic load in one, which is widely used in high-precision IV test and measurement for various discrete components, photovoltaic, new energy, battery and other industries. Semight Instrument provides high-precision benchtop source meters and plug-in PXIe source meter modules of standard PXIe chassis, fully meeting the application of various test scenarios.

Details
Optical Chip Test
Optical Chip Test

Burn-in testing of laser is an important method to ensure the reliability of laser. Through the test of COC or bare die, the early failure of laser caused by the defects in the process of laser production can be screened out in advance. Semight Instrument provides a complete solution from bare die to COC, from high temperature(150℃ or higher) to low temperature (-40℃), with CoC automatic loading and unloading system, forming a complete test solution, Semight Instrument's laser chip burn-in/load/unload test system has been widely recognized by the market.

Details
Power Chip Test
Power Chip Test

The semiconductor front-end test is mainly used in the wafer processing to check whether the processing parameters of the wafer products meet the design requirements or there are defects affecting the yield after each step of the manufacturing process. The semiconductor back-end test equipment is mainly used after wafer processing to check whether the performance of the chip meets the requirements, which belongs to the electrical performance test. Semight Instrument provide integrated solutions such as wafer burn in and known good die tester, improve test efficiency and reduce test cost.

Details
After login Download Now!

account number

password

Registered account Download Now!

full name

Please enter your name *

e-mail address

Please enter your email address *

Email verification code

Please enter your email verification code

Telephone

Please enter your contact number *

password

Please enter your login password *

Confirm Password

Please enter your login password again *
Retrieve password

e-mail address

Please enter your email number *

Email verification code

Please enter your email verification code

New Password

Please enter your login password *

Confirm Password

Please enter your login password again *