Please enter search keywords!

Site Map

Site Map

Burst Error Ratio Tester

rBT1250

10G Burst Mode Bit Error Ratio Tester


Semight rBT1250 is specially designed for optical line terminal (OLT) test of passive optical network (PON) applications, and supports 1.25G EPON, GPON, 2.5G XGPON, Combo PON, 10G EPON and 10G XGSPON burst bit error testing and analysis.


Features

  • High compatibility

    Supports various PON OLT rates of 10.3125 Gbps and below
  • Support Combo-PON test

    Dual reset signal, support Combo-PON test
  • SD test

    Individual LOS monitoring/SD monitoring/LOS judgment for each channel
  • Built-in clock recovery

    It can work in a real long-fiber environment, avoiding the influence of long-fiber on delay and jitter

Features and Benefits



  • Dual reset signal, the reset position is adjustable (Combo-pon must have 2 reset signals)
  • Double packet test

    Each data packet has different attenuation, there are jumps between the phases of different data packets, and there are long consecutive "1" and "0" in the data packet;
    Need to simulate the worst 2 ONU signal generation.
  • Built-in clock recovery, support long fiber test

    The built-in clock recovery enables the rBT1250 to work in a real long-fiber working environment, which is basically impossible in other solutions commonly used in the industry, because those systems do not support clock recovery,It cannot adapt to the influence of long fiber on delay and jitter.
Pattern Generator Specifications
Output Type Difference

AC/DC Coupling, 100 Ω Termination

Single Ended

AC Coupling, 50 Ω Termination

Output Amplitude

100-600 mVp-p

Differential

Output Channel

3 independent Channels

Support Burst/Continuous mode signal generation 

Pattern

PRBS7,23,31, User Defined,CID pattern

Support Data Rate

1.25/2.5/9.953/10.3125 Gbps

Rise Time

<40 ps

20%~80%

Jitter

<12 ps

Peak to peak Jitter

Pre-emphasis

Support pre-weighting adjustment to improve the impact of test cable test fixture on signal quality 

Pattern Sequence

Each channel supports independent preamble/dead load/protection time pattern sequence setting

CID Pattern

Support add continuous “1”,continuous “0” pattern as length from 64-88 bits(adjustable)

Connector

SMA


文档下载

名称
版本
发布时间
下载
  • rBT1250 X-PON突发信号误码测试仪-使用说明书
    V7.0
    2022-07-20
    点击下载

Similar recommendation

Optical Network Test
Optical Network Test

Optical communication network plays an important role in the rapid development of big data, cloud computing, 5G communication and other markets.
Semight offers various of instruments for optical Transceiver/Component testing, including wide bandwidth sampling oscilloscope, NRZ/PAM4 bit error ratio tester , burst error ratio tester, fast wavelength meter, optical spectrum analyzer, high precise source measure unit, 400G network analyzer ,optical power meter, optical attenuator, optical switch etc. Provide cost-effective complete solutions.

Details
Electronic Measurement
Electronic Measurement

The high-precision source meter integrates the functions of voltage source, current source, voltmeter, ampere meter, and electronic load in one, which is widely used in high-precision IV test and measurement for various discrete components, photovoltaic, new energy, battery and other industries. Semight Instrument provides high-precision benchtop source meters and plug-in PXIe source meter modules of standard PXIe chassis, fully meeting the application of various test scenarios.

Details
Optical Chip Test
Optical Chip Test

Burn-in testing of laser is an important method to ensure the reliability of laser. Through the test of COC or bare die, the early failure of laser caused by the defects in the process of laser production can be screened out in advance. Semight Instrument provides a complete solution from bare die to COC, from high temperature(150℃ or higher) to low temperature (-40℃), with CoC automatic loading and unloading system, forming a complete test solution, Semight Instrument's laser chip burn-in/load/unload test system has been widely recognized by the market.

Details
Power Semiconductor Test
Power Semiconductor Test

The semiconductor front-end test is mainly used in the wafer processing to check whether the processing parameters of the wafer products meet the design requirements or there are defects affecting the yield after each step of the manufacturing process. The semiconductor back-end test equipment is mainly used after wafer processing to check whether the performance of the chip meets the requirements, which belongs to the electrical performance test. Semight Instrument provide integrated solutions such as wafer burn in and known good die tester, improve test efficiency and reduce test cost.

Details
Log in

Account number

Password

Register an account

Name

Please enter your name *

Email

Please enter your email address *

Email verfication code

Please enter your email verification code

Phone

Please enter your contact number *

Password

Please enter your login password *

Confirm Password

Please enter your login password again *
Retrieve password

e-mail address

Please enter your email number *

Email verification code

Please enter your email verification code

New Password

Please enter your login password *

Confirm Password

Please enter your login password again *