Please enter search keywords!

Site Map

Site Map

PXIe Source Meter Unit

S2016C

Single channel PXIe precision power supply/measurement unit


Semight S2016C is a compact and cost-effective single channel PXIe power supply/measurement unit that can simultaneously output and measure voltage and current. It can provide a maximum output of ± 200V, ± 1A (DC), ± 3A (pulse), and 20W constant power. It supports traditional SMU SCPI commands, making the migration of test code easy and fast. It supports existing PXIE chassis in large factories, supports multi card synchronization, and is integrated into production testing systems for use, To improve the testing efficiency of the system and reduce costs.



Features

  • High-precision

    Resolution up to 1fA/100nV
    Voltage accuracy 50 μV.
    Current accuracy 1 pA
  • High range, high-speed measurement

    ±200 V、±1 A(DC),
    ± 3A (pulse)
    Supports a maximum sampling rate of 1M
  • Adaptive PFC system

    Utilize Adaptive PFC
    (Precise-Fast Control) System,
    Users can adjust relevant parameters based on load characteristics
  • Building a single channel testing system

    Based on standard PXIe chassis, easy to expand

Features and Benefits

  • 5 functions in one

    Voltage source
    Current source
    Ammeter
    Voltmeter
    Electronic load
  • 1、 Three quadrants as the source: the actual polarity of the output V/I follows the source setting;
    2、 The four quadrants are the load: CC and CV cooperate, and when the load is used, the polarity of the load setting is opposite to the source polarity;
  • Test various devices

  • Capture more measurement data

    ♦ 6 and a half bit digital resolution: the accuracy is equivalent to a 6 and a half bit digital multimeter
    ♦ 1 fA/100 nV resolution: excellent sensitivity for setting and measuring
    ♦ 1M points/second: Provides high-speed measurement and can quickly set/digitize the rate for any waveform generator/list scanning;
  • Rich scanning functions

  • DC I-V output capability

  • Pulse I-V output capability


Voltage index  

Voltage accuracy

Range

Measurement resolution

Accuracy (1 year)

± (% reading+offset)

Typical noise (effective value)

0.1 Hz-10 Hz

±200 V

100 μV

0.03%+10 mV

400 μV

±40 V

10 μV

0.03%+2 mV

100 μV

±20V

10 μV

0.03%+1 mV

50 μV

±2 V

1 μV

0.03%+100 μV

10 μV

±0.6 V

100 nV

0.03%+50 μV

2 μV

temperature coefficient

±(0.15 × Accuracy index)/℃ (0℃-18℃, 28℃-50℃)

set time

<50 μs (Typical value)

overshoot

<±0.1% (Typical value, Normal, with steps ranging from 10% to 90%, full scale point, resistive load test)

Noise 10Hz-20MHz

20V voltage source, 1A resistive load, <5 mVrms

Current index

Current accuracy

Range

Measurement resolution

Accuracy (1 year)

± (% reading+offset)

Typical noise (effective value)

0.1 Hz-10 Hz

±3 A1

1 μA

0.03% + 2mA

20 μA

±1 A

100 nA

0.03% + 90 μA

4 μA

±100 mA

10 nA

0.03% + 9 μA

600 nA

±10 mA

1 nA

0.03% + 900 nA

60 nA

±1 mA

100 pA

0.03% + 90 nA

6 nA

±100 μA

10 pA

0.03% + 9 nA

700 pA

±1 μA

100 fA

0.03% + 200 pA

20 pA

±10 nA2

10 fA

0.06% +9 pA

600 fA

±1 nA2

1 fA

0.1% +3 pA

60 fA

±100 pA2

1 fA

0.3% +1 pA

30 fA

temperature coefficient

±(0.15 × Accuracy index)/℃ (0℃-18℃,28℃-50℃)

set time

<100 μs (Typical value)

overshoot

<±0.1% (Typical value, Normal, with steps ranging from 10% to 90%, full scale point, resistive load test)

1. 3A range only supports pulse mode, with typical accuracy

2. Additional specification conditions: NPLC configured with 10PLC


Pulse source indicator (4-wire)

Minimum programmable pulse width

100 μ S

Pulse width programming resolution

1 μ S

Pulse width programming accuracy

± 10 μ S

Pulse width jitter

2 μ S

Pulse width definition

As shown in the following figure, the time from the 10% leading edge to the 90% trailing edge

  

Pulse technical indicators

Maximum current limit

Maximum pulse width

Maximum duty cycle

1

0.1 A/200 V

DC, unlimited

100%

2

1 A/20 V

DC, unlimited

100%

3

3 A/66.6 V

1 ms

5%

4

3 A/160 V

400 μ S

2%


Pulse source rise time (4-wire)

Output

Maximum output

Typical rise time1

Typical stability time2

Test load

Voltage source

160 V

800 μ S

1.2 ms

Empty

5 V

40 μ S

100 μ S

Empty

Current source

3A~100 μ A

90 μ S

250 μ S

With full load3

1 μ A

300 μ S

600 μ S

With full load3

10 nA

5 ms

10 ms

With full load3

1 nA

10 ms

50 ms

With full load3

100 pA

100 ms

500 ms

With full load3

1. The time required for the pulse front to travel from 10% to 90%

2. The time required for the pulse to reach 1% of the final value

3. Test conditions: Normal pure resistance full load voltage rises to 6V



Output establishment time

Output

Range

Typical output establishment time1

Test conditions

Fast2

Normal

Slow

Voltage source

200 V

<five hundred μ S

<nine hundred μ S

<2 ms

The time required to reach within 0.1% of the final value under open circuit load conditions. Stepping is within the range of 10% to 90%

40 V

<two hundred μ S

<four hundred μ S

<nine hundred μ S

20 V

<sixty μ S

<one hundred μ S

<five hundred μ S

2 V

<fifty μ S

<fifty μ S

<fifty μ S

Current source

3 A~100 μ A

<fifty μ S

<one hundred μ S

<0.8 ms

Under normal conditions and full load, the voltage output reaches 6V. Reaching within 0.1% of the final value (for 3 A The time required for a range of 0.3%. Step is 10% of the range to 90%

1 μ A

<three hundred μ S

<four hundred μ S

<1 ms

10 nA

<10 ms

<10 ms

<10 ms

1 nA

<50 ms

<50 ms

<50 ms

100 pA

<500 ms

<500 ms

<500 ms

1. Output conversion rate: Fast, Normal, Slow. Users can adjust APFC parameters based on load characteristics to obtain appropriate setup time or stability

2. Fast mode may produce significant overshoot under different range or load conditions. It is recommended to use normal or slow mode for overshoot sensitive devices


Similar recommendation

Optical Network Test
Optical Network Test

Optical communication network plays an important role in the rapid development of big data, cloud computing, 5G communication and other markets.
Semight offers various of instruments for optical Transceiver/Component testing, including wide bandwidth sampling oscilloscope, NRZ/PAM4 bit error ratio tester , burst error ratio tester, fast wavelength meter, optical spectrum analyzer, high precise source measure unit, 400G network analyzer ,optical power meter, optical attenuator, optical switch etc. Provide cost-effective complete solutions.

Details
Electronic Measurement
Electronic Measurement

The high-precision source meter integrates the functions of voltage source, current source, voltmeter, ampere meter, and electronic load in one, which is widely used in high-precision IV test and measurement for various discrete components, photovoltaic, new energy, battery and other industries. Semight Instrument provides high-precision benchtop source meters and plug-in PXIe source meter modules of standard PXIe chassis, fully meeting the application of various test scenarios.

Details
Optical Chip Test
Optical Chip Test

Burn-in testing of laser is an important method to ensure the reliability of laser. Through the test of COC or bare die, the early failure of laser caused by the defects in the process of laser production can be screened out in advance. Semight Instrument provides a complete solution from bare die to COC, from high temperature(150℃ or higher) to low temperature (-40℃), with CoC automatic loading and unloading system, forming a complete test solution, Semight Instrument's laser chip burn-in/load/unload test system has been widely recognized by the market.

Details
Power Semiconductor Test
Power Semiconductor Test

The semiconductor front-end test is mainly used in the wafer processing to check whether the processing parameters of the wafer products meet the design requirements or there are defects affecting the yield after each step of the manufacturing process. The semiconductor back-end test equipment is mainly used after wafer processing to check whether the performance of the chip meets the requirements, which belongs to the electrical performance test. Semight Instrument provide integrated solutions such as wafer burn in and known good die tester, improve test efficiency and reduce test cost.

Details
Log in

Account number

Password

Register an account

Name

Please enter your name *

Email

Please enter your email address *

Email verfication code

Please enter your email verification code

Phone

Please enter your contact number *

Password

Please enter your login password *

Confirm Password

Please enter your login password again *
Retrieve password

e-mail address

Please enter your email number *

Email verification code

Please enter your email verification code

New Password

Please enter your login password *

Confirm Password

Please enter your login password again *