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Known Good Die

PB6600

SiC KGD Die Handler


Semight Instruments PB6600 KGD Die Handler can be mainly used for power chip Die-level dynamic and static test to implement the screening of chip performance indicators and improve the first pass yield of the module after packaging. The testers in the corresponding specifications can be configured by test items, test conditions and test parameters. According to customer requirements, can supports the customized development. The system supports frame ring input and output.


特点

  • Strong expandability

    The handler with transport part (PB6600) is separated from the test part
  • Six parallel tests

    Support up to 6 test stations, different test stations support different test conditions and items
  • Dynamic and static test

    Satic test 2000V/600A ,
    Dnamic test 1200V/2000A
  • Accurate test results

    Room temperature ~ 200 ℃,
    accuracy<±3°C,resolution:0.1°C
  • Hard docking

    Stray inductance of the dynamic test system≤50nH
  • Nitrogen pressure test

    The sealed cavity design is adopted for the probe card, with the nitrogen pressure monitoring function, which can maintain pressure and prevent arcing;
  • UPH capability >1400pcs

    Single test station test time≤1s


Static parameter test list

Test type

Item

Description

Static test parameters 
(more parameters according tester)

Vds

Drain - Source Voltage

Vth

Gate Threshold Voltage

Idss

Zero Gate Voltage Drain Current

Igss

Gate-Source Leakage Current

Rds(on)

Drain-Source On-State Resistance

Vsd

Diode Forward Voltage


Dynamic test parameter list

Test type

Item

Description

UIS test parameters
(more parameters according tester)

Rint

Gate Input Resistence

Ciss

Input Capacitance

Coss

Output Capacitance

Crss

Reverse Transfer Capacitance

Eoss

Coss Stored Energy

AC Characteristics 
(more parameters according tester)

Isc

Short-circuit Current

Td(on)

Turn-On Delay Time

Tr

Rise Time

Tf(off)

Turn-Off Delay Time

Tf

Fall Time

Eon

Turn Off Switching Energy

Eoff

Fall Time

Trr

Reverse Recovery Time

Qrr

Reverse Recovery Charge

Irrm

Peak Reverse Recovery Current

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