Q&A
Q&A
Common Problem
?Q
SMU - is dual channel internal common ground?
?Q
SMU - device interface problem
?Q
SMU - electric shock damages the device under test
?Q
SMU - when the dual channel synchronization function is turned on, if the main channel is configured as a current source, connect the measured part (LR series element) to the probe of the main channel, and measure the magnetic coupling current of the measured part on the slave channel, if the: output1 command is not sent to the slave channel, only the: init command is sent to the slave channel, can the sensing current sampling data be read from the slave channel smoothly?
?Q
SMU - the command output1 precedes the command: will the issue of init affect the accuracy of measurement data? (difference in order of issue)
?Q
SMU - how to set the master channel and slave channel when dual channel synchronous DC pulse linear scanning
?Q
SMU - is there a quantitative relationship between pulse width and pulse delay time?
?Q
SMU - trig: what are the trigger points set by count? If it is not set, what impact will it have on the test?
?Q
SMU - what is the concept of source delay time (MS)?
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