High speed Transceiver ATE
Optical Transceiver Tester
The ATE (Automatic Test Equipment) integrated testing system combines various test cases for transceiver and integrates the sub-functional modules according to the functional requirements ratio. Users can flexibly configure the system according to their actual testing needs, improving the utilization of transceiver test instruments and effectively reducing testing costs. The system's integrated software encapsulates various parameters in transceiver testing, allowing users to quickly build the test system like building blocks and accelerate the mass production introduction of new products.
The entire system adopts multi-channel parallel testing, combining software and hardware to fully utilize the functions of instruments and software, significantly improving the testing efficiency of each unit product.
Plug-in Optical paltformEach functional module is encapsulated into a plug-in module, allowing users to flexibly optimize hardware configuration
Software platformThe software is highly encapsulated, and each sub-function module of the software can be arbitrarily called and combined at will
Multi-channel parallel testingIncrease the number of channels, parallel test, greatly improve test efficiency
Integrated TEC temperature control systemSupport module -10~85℃ temperature cycle test
Features and Benefits
Plug-in optical platformIntegrate common optical instruments Optical power meter/optical switch/optical decay/optical CDR Integrate common passive components MUX/DEMUX/Splitte Flexible configuration
Integrated thermal cycling test systemTEC-based temperature control system
Platform software systemSubfunction Modularization
Automatically generate software reportsPass rate analysis
Optical communication network plays an important role in the rapid development of big data, cloud computing, 5G communication and other markets.
Semight Instruments offers various of instruments for optical Transceiver/Component testing, including wide bandwidth sampling oscilloscope, NRZ/PAM4 bit error ratio tester , burst error ratio tester, fast wavelength meter, optical spectrum analyzer, high precise source measure unit, 400G network analyzer ,optical power meter, optical attenuator, optical switch etc. Provide cost-effective complete solutions.
The high-precision source meter integrates the functions of voltage source, current source, voltmeter, ampere meter, and electronic load in one, which is widely used in high-precision IV test and measurement for various discrete components, photovoltaic, new energy, battery and other industries. Semight Instrument provides high-precision benchtop source meters and plug-in PXIe source meter modules of standard PXIe chassis, fully meeting the application of various test scenarios.Details
Burn-in testing of laser is an important method to ensure the reliability of laser. Through the test of COC or bare die, the early failure of laser caused by the defects in the process of laser production can be screened out in advance. Semight Instrument provides a complete solution from bare die to COC, from high temperature(150℃ or higher) to low temperature (-40℃), with CoC automatic loading and unloading system, forming a complete test solution, Semight Instrument's laser chip burn-in/load/unload test system has been widely recognized by the market.Details
The semiconductor front-end test is mainly used in the wafer processing to check whether the processing parameters of the wafer products meet the design requirements or there are defects affecting the yield after each step of the manufacturing process. The semiconductor back-end test equipment is mainly used after wafer processing to check whether the performance of the chip meets the requirements, which belongs to the electrical performance test. Semight Instrument provide integrated solutions such as wafer burn in and known good die tester, improve test efficiency and reduce test cost.Details
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