New requirements for vehicle specification level power semiconductor testing-Semight Instruments

Different from consumer grade products, automobiles will operate in harsh environments such as outdoor, high temperature, cold and humid, and the design life is generally 15 years or 200000 kilometers. The iteration cycle will be much higher than that of consumer electronics for 2-3 years, and the requirements on environment, vibration, impact, reliability and consistency are also high. Therefore, automobile enterprises usually require suppliers to use vehicle grade components to ensure the quality and reliability of on-board ECU products.

Vehicle specification level power chips put forward higher requirements for testing:

Higher voltage current

SiC needs higher test current and voltage test

1700V MOSFET has been mature, and subsequent 3300v demand

Higher switching speed

SiC / GaN requires higher switching speed test

Higher reliability

Before packaging, it must be ensured that the chip with complete reliability is used for packaging

Higher packaging density

Before packaging, it is necessary to ensure that the chip with complete performance is packaged

In order to meet the requirements of vehicle regulations, the testing procedures of power devices are more stricter. The schematic diagram of testing procedures is as follows:

Semight has developed semiconductor testing machine (SiC KGD Handler PB6600, Wafer Level Burn-in System WLBI3800) and other equipment in combination with its core advantages, such as weak signal detection, high-power signal detection and complex probe system design, Help the high-speed and high-quality development of power devices.

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