MBT3210-Semight Instruments

Characteristic

Wide speed range
Support 350 Mbps ~15 Gbps standard test rate
Support parallel testing
Four channels can be tested independently or synchronously
High speed clock output
Provide half rate clock (high speed) and sub trigger signal output (low speed)
Built in clock recovery
Built in clock data recovery of each channel

Functions and advantages

Agreement	Rate
Ethernet	1.25/2.5/9.953/10.3125 Gbps
Fiber	4.25/8.5/14.025 Gpbs
G.984.2	622 Mbps/2.488 Gbps
InfiniBand	2.5/5/14.0625 Gbps
SONET/SDH	622 Mbps/2.488 Gbps/9.953 Gbps/10.709 Gpbs/11.096 Gbps

It covers a wide range of rates and supports a variety of protocols

Pattern Generator Technical Indicators	Type of output	Differential	AC coupling; 100 Ω terminal
		Single ended	AC coupling; 50 Ω terminal
	Output amplitude	100~1200 mVp-p	Differential
	Rise Time	30 ps	20%~80%
	Shake	1.5 ps	Root mean square (RMS) jitter
		9 ps	Peak-to-peak Jitter
Clock channel	The front panel provides half rate differential clock and frequency division trigger signal output
Bit Error Detection Channel	Input type	Differential / single ended
	Impedance	100 Ω
	Input amplitude range	800 mVp-p
	Sensitivity	<100 mV
	Clock mode	Built-in Clock Recovery
	Synchronization	Automatic phase synchronization by level
	Connector	2.92 mm female，50Ω
General indicators	work	0°C~+55°C，30%~80% Relative Humidity with no condensation
	Storage	-30°C~70°C，10%~90% Relative Humidity with no condensation
	altitude	Operation：0m to 2000m， Storage：0m to 4600m
	Power Supply	LINE：100-240 VAC，50/60 Hz，250 W FUSE：T2AL 250 VAC
	Size	438214105 mm (with foot pad/handle)
	Weight	Net Weight 3.7 kg

Similar recommendation

Optical Network Test

Optical communication network plays an important role in the rapid development of big data, cloud computing, 5G communication and other markets.
Semight Instruments offers various of instruments for optical Transceiver/Component testing, including wide bandwidth sampling oscilloscope, NRZ/PAM4 bit error ratio tester , burst error ratio tester, fast wavelength meter, optical spectrum analyzer, high precise source measure unit, 400G network analyzer ,optical power meter, optical attenuator, optical switch etc. Provide cost-effective complete solutions.

Details

Electrical Performance Test

The high-precision source meter integrates the functions of voltage source, current source, voltmeter, ampere meter, and electronic load in one, which is widely used in high-precision IV test and measurement for various discrete components, photovoltaic, new energy, battery and other industries. Semight Instrument provides high-precision benchtop source meters and plug-in PXIe source meter modules of standard PXIe chassis, fully meeting the application of various test scenarios.

Details

Optical Chip Test

Burn-in testing of laser is an important method to ensure the reliability of laser. Through the test of COC or bare die, the early failure of laser caused by the defects in the process of laser production can be screened out in advance. Semight Instrument provides a complete solution from bare die to COC, from high temperature(150℃ or higher) to low temperature (-40℃), with CoC automatic loading and unloading system, forming a complete test solution, Semight Instrument's laser chip burn-in/load/unload test system has been widely recognized by the market.

Details

Power Chip Test

The semiconductor front-end test is mainly used in the wafer processing to check whether the processing parameters of the wafer products meet the design requirements or there are defects affecting the yield after each step of the manufacturing process. The semiconductor back-end test equipment is mainly used after wafer processing to check whether the performance of the chip meets the requirements, which belongs to the electrical performance test. Semight Instrument provide integrated solutions such as wafer burn in and known good die tester, improve test efficiency and reduce test cost.

Details

Site Map