MBT3210-Semight Instruments

Features

Various Data Rates
Supports 350 Mbps ~15 Gbps standard test rate
Supports Parallel Testing
Four channels can be tested independently or synchronously
High Speed Clock Output
Provides half-rate clock (high speed) and sub-trigger signal output (low speed)
Built-in Clock Recovery
Built-in clock data recovery of each channel

Functions and Advantages

Agreement	Rate
Ethernet	1.25/2.5/9.953/10.3125 Gbps
Fiber	4.25/8.5/14.025 Gbps
G.984.2	622 Mbps/2.488 Gbps
InfiniBand	2.5/5/14.0625 Gbps
SONET/SDH	622 Mbps/2.488 Gbps/9.953 Gbps/10.709 Gbps/11.096 Gbps

It covers a wide range of rates and supports a variety of protocols

Pattern Generator Technical Indicators	Type of Output	Differential	AC coupling; 100 Ω terminal
		Single-ended	AC coupling; 50 Ω terminal
	Output Amplitude	100~1200 mVp-p	Differential
	Rise Time	30 ps	20%~80%
	Shake	1.5 ps	Root mean square (RMS) jitter
		9 ps	Peak-to-peak Jitter
Clock Channel	The front panel provides half rate differential clock and frequency division trigger signal output
Bit Error Detection Channel	Input Type	Differential / single-ended
	Impedance	100 Ω
	Input Amplitude Range	800 mVp-p
	Sensitivity	<100 mV
	Clock Mode	Built-in Clock Recovery
	Synchronization	Automatic phase synchronization by level
	Connector	2.92 mm female, 50Ω
General Indicators	Work	0°C~+55°C, 30%~80% Relative Humidity with no condensation
	Storage	-30°C~70°C,10%~90% Relative Humidity with no condensation
	Altitude	Operation: 0m to 2000m Storage: 0m to 4600m
	Power Supply	LINE: 100-240 VAC, 50/60 Hz, 250 W FUSE: T2AL 250 VAC
	Size	438214105 mm (with foot pad/handle)
	Weight	Net Weight 3.7 kg

Similar recommendation

High Speed Communication Test

High speed communication test plays an important role in the rapid development of big data, cloud computing, 5G communication and other markets.
Semight offers various of instruments for optical Transceiver/Component testing, including wide bandwidth sampling oscilloscope, NRZ/PAM4 bit error ratio tester , burst error ratio tester, fast wavelength meter, optical spectrum analyzer, high precise source measure unit, 400G network analyzer ,optical power meter, optical attenuator, optical switch etc. We provide cost-effective, complete solutions for optical testing.

Details

Electronic Measurement

The high-precision source measure units integrates the functions of voltage source, current source, voltmeter, ampere meter, and electronic load in one, which is widely used in high-precision IV test and measurement for various discrete components, photovoltaic, green energy, battery and other industries. Semight provides high-precision benchtop SMU and plug-in PXIe SMU of standard PXIe chassis, fully meeting the application of various test scenarios.

Details

Optical Chip Test

Burn-in testing of laser is an important method to ensure the reliability of laser. Through the test of CoC or bare die, the early failure of laser caused by the defects in the process of laser production can be screened out in advance. Semight provides a complete solution from bare die to CoC, from high temperature(150℃ or higher) to low temperature (-40℃), with CoC automatic loading and unloading system, forming a complete test solution, Semight's laser chip burn-in/load/unload test system has been widely recognized by the market.

Details

Power Semiconductor Test

The semiconductor front-end test is mainly used in the wafer processing to check whether the processing parameters of the wafer products meet the design requirements or there are defects affecting the yield after each step of the manufacturing process. The semiconductor back-end test equipment is mainly used after wafer processing to check whether the performance of the chip meets the requirements, which belongs to the electrical performance test. Semight provides solutions such as Wafer Level Burn In system and Known Good Die handler for SiC testing, offering the value to customer in test efficiency improvement and test cost reduction.

Details

Site Map