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Wafer Level Reliability

WLR0200

Wafer level reliability testing system


Semight Instruments WLR0200 is designed according to the JEDEC reliability testing standard and is mainly designed for A testing system for evaluating the reliability of Sic wafers, which can achieve the testing of devices TDDB, QBD, BTI, AC_ Testing of functions such as BTI, CV, Vth, etc.

Features

  • High temperature resistance

    Probe table temperature up to 300 ℃
  • Supports 2-12 inch wafers

    using MPI customized high-temperature semi-automatic probe stations
  • High testing frequencyup to 1MHz

    Using high-precision and high-frequency capacitance testing instruments
  • Independently developed

    The testing source table adopts high-precision SMU self-developed by Lianxun Instrument
  • Implement automatic testing and data analysis

    for TDDB/QBD/BTI/AC BTI/Vth/CV
  • MAP chart format

    Data can be presented as a MAP chart, and the data output format is optional
  • Nitrogen protection to prevent oxidation



System Device size (W x D x H) 1100mm; X  1150mm; X  2000mm
System power 2KVA
DUT; quantity 1  Wafer
MES system interface Support customized development and integration with customer MES systems and data
OS WLR_ OS @ Windows; ten
Test monitor OS Windows; ten
CPU I7-10200
storage 16GB@ DDR4
HDD 2T; SSD
Ethernet 10/100/1000base TX; X2
display 21.5; In  Wide  Monitor
Z1-PLUS Wafer size Up; To  12  Inch
X-Y; Movement Travel 260mm (X) / 280mm (Y)
Resolution zero point one μ M (X) / zero point one μ M  (Y)
Repeatability one point five μ M
Z  Movement Travel 10mm
Resolution 0.1μm
Repeatability ±1μm
Theta Movement Travel ±7.5°
Resolution 0.0004°
Temperature Temperature range RT~300 ℃
Temperature uniformity ± 1.5 ℃ @ 300 ℃


Voltage & Current

Measurement

Wafer Size

Up to 12 inch

Current Accuracy

±150mA

0.2%+25μA

±15mA

0.2%+5μA

±1.5mA

0.2%+150nA

±150μA

0.2%+20nA

±15μA

0.2%+3nA

±1.5μA

0.3%+600pA

±150nA

0.5%+300pA

Voltage Accuracy

±200V

0.2%+40mV

±20V

0.2%+5mV

QBD

Current Accuracy

±10mA

0.2%+2μA

±1mA

0.2%+100nA

±100μA

0.2%+20nA

±10μA

0.2%+2nA

AC BTI

Voltage Accuracy

±55V

0.5%+10mV@500KHz

±10V

0.5%+2mV@500KHz

±1V

0.5%+1mV@500KHz


LCR parameters Measurement parameters Cs D,  Cs Q,  Cs Rs, Cp-D,  Cp Q,  Cp Rp,  Cp-G
Frequency 120; Hz,  1  KHz,  1  MHz
Measurement accuracy 120; Hz; (@ 100 uF, 0.5 V) C:   0.085%,  D:   zero point zero zero zero six five
1  KHz; (@ 10 nF, 1 V) C:   0.07%,  D:   zero point zero zero zero five
1  MHz; (@ 10 pF, 1 V) C:   0.07%,  D:   zero point zero zero zero five
Cable length 0m, 1m, 2m

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