Wafer Level Reliability
WLR0200
Wafer level reliability testing system
Features
High temperature resistance
Probe table temperature up to 300 ℃Supports 2-12 inch wafers
using MPI customized high-temperature semi-automatic probe stationsHigh testing frequencyup to 1MHz
Using high-precision and high-frequency capacitance testing instrumentsIndependently developed
The testing source table adopts high-precision SMU self-developed by Lianxun InstrumentImplement automatic testing and data analysis
for TDDB/QBD/BTI/AC BTI/Vth/CVMAP chart format
Data can be presented as a MAP chart, and the data output format is optionalNitrogen protection to prevent oxidation
System | Device size (W x D x H) | 1100mm; X 1150mm; X 2000mm | |
System power | 2KVA | ||
DUT; quantity | 1 Wafer | ||
MES system interface | Support customized development and integration with customer MES systems and data | ||
OS | WLR_ OS @ Windows; ten | ||
Test monitor | OS | Windows; ten | |
CPU | I7-10200 | ||
storage | 16GB@ DDR4 | ||
HDD | 2T; SSD | ||
Ethernet | 10/100/1000base TX; X2 | ||
display | 21.5; In Wide Monitor | ||
Z1-PLUS | Wafer size | Up; To 12 Inch | |
X-Y; Movement | Travel | 260mm (X) / 280mm (Y) | |
Resolution | zero point one μ M (X) / zero point one μ M (Y) | ||
Repeatability | one point five μ M | ||
Z Movement | Travel | 10mm | |
Resolution | 0.1μm | ||
Repeatability | ±1μm | ||
Theta Movement | Travel | ±7.5° | |
Resolution | 0.0004° | ||
Temperature | Temperature range | RT~300 ℃ | |
Temperature uniformity | ± 1.5 ℃ @ 300 ℃ |
Voltage & Current Measurement |
Wafer Size |
Up to 12 inch |
|
Current Accuracy |
±150mA |
0.2%+25μA |
|
±15mA |
0.2%+5μA |
||
±1.5mA |
0.2%+150nA |
||
±150μA |
0.2%+20nA |
||
±15μA |
0.2%+3nA |
||
±1.5μA |
0.3%+600pA |
||
±150nA |
0.5%+300pA |
||
Voltage Accuracy |
±200V |
0.2%+40mV |
|
±20V |
0.2%+5mV |
||
QBD Current Accuracy |
±10mA |
0.2%+2μA |
|
±1mA |
0.2%+100nA |
||
±100μA |
0.2%+20nA |
||
±10μA |
0.2%+2nA |
||
AC BTI Voltage Accuracy |
±55V |
0.5%+10mV@500KHz |
|
±10V |
0.5%+2mV@500KHz |
||
±1V |
0.5%+1mV@500KHz |
LCR parameters | Measurement parameters | Cs D, Cs Q, Cs Rs, Cp-D, Cp Q, Cp Rp, Cp-G | |
Frequency | 120; Hz, 1 KHz, 1 MHz | ||
Measurement accuracy | 120; Hz; (@ 100 uF, 0.5 V) | C: 0.085%, D: zero point zero zero zero six five | |
1 KHz; (@ 10 nF, 1 V) | C: 0.07%, D: zero point zero zero zero five | ||
1 MHz; (@ 10 pF, 1 V) | C: 0.07%, D: zero point zero zero zero five | ||
Cable length | 0m, 1m, 2m |
Similar recommendation
mailbox
Service hotline
follow
full name
e-mail address
Email verification code
Telephone
password
Confirm Password
e-mail address
Email verification code
New Password
Confirm Password