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S3023P

Single channel high-voltage semiconductor testing pulse source



Semight InstrumentsS3023P It is a single channel semiconductor testing pulse source that can output adjustable high-precision high-voltage pulse sources.


Features

  • High voltage range

    ±40V,Meet NVM testing technical conditions
  • High voltage with fast rate of change

    1000V/us,A high-voltage pulse source that can generate faster edges
  • Standard pulse mode

    three-level pulse, period:40ns~10s
  • Delay adjustable

    time:0~9.999S,resolution ratio:2.5ns
  • high-speed measurement

    500MS/s,Timely diagnosis of load impedance
  • Adjustable pulse count

    range:1~100,000个
  • Minimum sampling period for voltage detection

    5us
  • Level timing trigger

    TTLLevel, pulse cycle synchronization




Features and Benefits

  • working conditions:

    Temperature 23 ℃± 5 ℃
    Humidity 30% to 70% relative humidity Measure after preheating for 60 minutes, and the ambient temperature change during measurement is less than ± 3 ° C
    Calibration cycle is 1 year
    Measurement speed 1 PLC


Pulse or DC output voltage indicators

Project Test conditions Technical indicators Remarks

Voltage amplitude


50 Ω load -20V~+20V



Open circuit -40V~+40V



Voltage amplitude resolution



50 Ω load

0.2mV |Vout | ≤ 5V
0.8mV 0.5V ≤ | Vout | ≤ 20V


open circuit
0.4mV | Vout | ≤ 10V
1.6mV 10V ≤ | Vout | ≤ 40V
Output interface


SMA


Internal resistance


50 Ω ± 1%


Output short-circuit current


800mA peak (400mA mean)


Output overshoot (ringing) 50 Ω load ± (5%+20mV)



Pulse or DC output voltage indicators (both with 50 Ω terminal load, should be open-loop control indicators, high-speed pulse)

Project Sub projects Technical indicators Remarks
Frequency range


0.1~33MHz



Pulse period



Programmable range 40ns~10s


Resolution 10ns


Minimum cycle 100ns Vamp ≤ 10V
Accuracy ± 1% (0.01%+200ps)




Pulse width



Programmable range 20ns~(pulse period -10ns)



Resolution

2.5ns Vamp< 10V
20ns Vamp>10V
Minimum value (10%~90% edge) 120ns


Accuracy ± (3%+2ns)






Pulse process time (Tr and Tf)





Programmable range 20ns~400ms



Resolution

2ns Tr+Tf ≤ 10us
20ns Tr+Tf>10us



Minimum value (10%~90% edge)


30ns Vamp ≤ 5V
35ns Vamp ≤ 10V
40ns Vamp ≤ 20V
60ns Vamp>20V


Accuracy

-5%~+5%+25ns Vamp ≤ 10V
-5%~+5%+40ns Vamp ≤ 20V


SPGU supplementary indicators

Advanced features:

Project Technical indicators Test conditions
Pulse width jitter 0.001%+150ps


Pulse period jitter 0.001%+150ps


Maximum voltage swing rate 1000V/us Vamp=40V (50 Ω Load)
Output noise 20mVrms


Voltage monitoring SPGU monitoring and testing unit terminal voltage


Measurement accuracy ± (0.1%+25mV)


Measurement resolution 50uV


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