S2011C Single-Channel PXIe Precision Source Meter-Semight Instruments

特点

High transmission rate
Single channel standard pxie precision power supply
High range
±60 V、±3 A（direct）、±10 A（pulse）
High resolution
The minimum measurement resolution can reach 100fA / 100nV
Easy to expand
It is used in standard pxie chassis to easily realize multi-channel expansion

Functions and advantages

(5) function in one body
Voltage source
Current source
Ammeter
Voltmeter
Electronic load
1、 Three quadrants as the source: the actual polarity of output V / I follows the source setting；
2、 The four quadrants are loads: CC and CV cooperate. When the load is used, the polarity of the load setting is opposite to the source polarity；
Can test various equipment
Capture more measurement data
♦ 6.5-digit resolution: Enjoy best-in-class 6.5-digit sourcing and measurement resolution；
♦ 100 fA / 100 nV resolution: excellent sensitivity for setting and measuring；
♦ 1M points / second: provide high-speed measurement, and can quickly set / digitize the rate to any waveform generator / list scan；
Rich scanning function
DC I-V output capacity
Pulse I-V output capacity

Voltage Programming and Measurement specifications

Voltage accuracy	Range	Programming resolution	Accuracy (1 Year) ± (% reading+ offset)	Typical Noise(RMS) 0.1 Hz-10Hz
	±60 V	10 μV	0.02%+3 mV	200 μV
	±6 V	1 μV	0.02%+0.3 mV	60 μV
	±0.6 V	100 nV	0.02%+50 μV	20 μV
Temperature coefficient	±(0.15 × accuracy)/°C (0℃-18℃,28℃-50℃)
Settling time	<50μs (typical)
Overshoot	<±0.1% (Typical.Normal.Step is 10 % to 90 % range, full range, resistive load)
Noise 10Hz-20MHz	6 V voltage source, 3A resistive load, <5 mVrms

Current Programming and Measurement specifications

Current accuracy	Range	Programming resolution	Accuracy (1 Year) ± (% reading+ offset)	Typical Noise(RMS) 0.1 Hz-10Hz
	±10 A¹	1 μA	0.03% + 2mA	20 μA
	±3 A	1 μA	0.03% + 2 mA	20 μA
	±1 A	100 nA	0.03% + 90 μA	3 μA
	±100 mA	10 nA	0.03% + 9 μA	200 nA
	±10 mA	1 nA	0.03% + 900 nA	20 nA
	±1 mA	100 pA	0.03% + 90 nA	2 nA
	±100 μA	10 pA	0.03% + 9 nA	200 pA
	±10 μA	1 pA	0.03% +1 nA	30 pA
	±1 μA	100 fA	0.03% + 200 pA	5 pA
Temperature coefficient	±(0.15 × accuracy)/°C (0℃-18℃,28℃-50℃)
Settling time	<100μs (typical)
Overshoot	<±0.1% (Typical.Normal.Step is 10 % to 90 % range, full range, resistive load)

1、10 A range is available only for pulse mode, accuracy specifications for 10 A range are typical.

Pulse source specifications （4W）

Minimum programmable pulse width				100 μs
Pulse width programming resolution				1 μs
Pulse width programming accuracy				±10 μs
Pulse width jitter				2 μs
Pulse width definition				The time from 10 % leading to 90 % trailing edge as follows

Item	Maximums	Maximum pulse width	Maximum duty cycle
1	0.4 A/50 V	DC, no limit	1
2	1 A/20 V	DC, no limit	1
3	3 A/6.6 V	DC, no limit	1
4	10 A/20 V	1ms	0.05
5	10 A/50 V	400 μs	0.02

Typical Pulse Performance（4W）

Source	range	Typical rise time¹	Typical Settling Time2	Test load
Voltage	50 V	250 μs	400 μs	NO load
	5 V	40 μs	100 μs	NO load
Current	10 A~100 μA	90 μs	250 μs	Full load³
	10 μA	120 μs	300 μs	Full load³
	1 μA	300 μs	600 μs	Full load³

1、Leading edge, the time from 10 % leading to 90 % leading

2、The time required from Pulse out 0 to reach within 1 % of final value

3、Test condition: Normal, resistive load 6V maximum output

Typical output settling time

Source	Range	Output settling time¹			Condition
Source	Range	Fast²	Normal	Slow	Condition
Voltage	60 V	<120 μs	<300 μs	<1 ms	Time required to reach within 0.1 % of final value at open load condition. Step is 10 % to 90 % range
	6 V	<30 μs	<50 μs	<300 μs
	0.6 V	<30 μs	<50 μs	<300 μs
Current	3 A~100 μA	<50 μs	<100 μs	<0.8 ms	Time required to reach within 0.1 % (0.3 % for 3 A range) of final value at short condition. Step is 10 % to 90 % range
	10 μA	<100 μs	<150 μs	<0.8 ms
	1 μA	<300 μs	<400 μs	<1 ms

1、Output transition speed：Fast, Normal, Slow. Users can adjust the APFC parameters based on the load characteristics to obtain precision, and fast output characteristics

2、Slow mode is recommended for overshoot sensitive equipment, Fast mode may have overshoot on output in some condition

Sampling rate and NPLC setting

Setting				Range
NPLC				0.00005 PLC ~ 10 PLC
Sampling Rate				5 sps ~ 1 Msps

Derating accuracy with PLC setting< 1 PLC

Add % of range using the following table for measurement with PLC < 1
PLC	Range
PLC	600 mV	6 V	60 V	1 μA	10 μA	100 μA to 100 mA	1 A to 3 A
0.1	0.02%	0.01%	0.01%	0.02%	0.01%	0.01%	0.01%
0.01	0.30%	0.03%	0.02%	0.20%	0.04%	0.02%	0.02%
0.001	3.20%	0.40%	0.10%	2.50%	0.40%	0.03%	0.03%

Supplemental characteristics

Sensing Modes				2-wire or 4-wire (Remote-sensing) connections
Maximum sense lead resistance				1 KΩ for rated accuracy
Max voltage between High Force and High Sense				2 V
Maximum output voltage in output connector				>range 105%（60 V range>60.5 V）
Sweep				Sweep step time: from 20μs to 16s, Max: 8K point
Auto range				Support，turn off output is recommended for overshoot sensitive equipment before range change
Source delay				Support，It is recommended that users set appropriate source delay to obtain higher accuracy
Over temperature protection				The output will be turned off (also disable operation) when the SMU internal temperature is detected higher than 85 degrees. When the temperature returns to less than 65 degrees, operation recover
Other abnormal protection				Power reset，recover operation or hardware damage

文档下载

名称

版本

发布时间

下载

Democode

名称

版本

发布时间

下载

Similar recommendation

Optical Network Test

Optical communication network plays an important role in the rapid development of big data, cloud computing, 5G communication and other markets.
Semight Instruments offers various of instruments for optical Transceiver/Component testing, including wide bandwidth sampling oscilloscope, NRZ/PAM4 bit error ratio tester , burst error ratio tester, fast wavelength meter, optical spectrum analyzer, high precise source measure unit, 400G network analyzer ,optical power meter, optical attenuator, optical switch etc. Provide cost-effective complete solutions.

Details

Electrical Performance Test

The high-precision source meter integrates the functions of voltage source, current source, voltmeter, ampere meter, and electronic load in one, which is widely used in high-precision IV test and measurement for various discrete components, photovoltaic, new energy, battery and other industries. Semight Instrument provides high-precision benchtop source meters and plug-in PXIe source meter modules of standard PXIe chassis, fully meeting the application of various test scenarios.

Details

Optical Chip Test

Burn-in testing of laser is an important method to ensure the reliability of laser. Through the test of COC or bare die, the early failure of laser caused by the defects in the process of laser production can be screened out in advance. Semight Instrument provides a complete solution from bare die to COC, from high temperature(150℃ or higher) to low temperature (-40℃), with CoC automatic loading and unloading system, forming a complete test solution, Semight Instrument's laser chip burn-in/load/unload test system has been widely recognized by the market.

Details

Power Chip Test

The semiconductor front-end test is mainly used in the wafer processing to check whether the processing parameters of the wafer products meet the design requirements or there are defects affecting the yield after each step of the manufacturing process. The semiconductor back-end test equipment is mainly used after wafer processing to check whether the performance of the chip meets the requirements, which belongs to the electrical performance test. Semight Instrument provide integrated solutions such as wafer burn in and known good die tester, improve test efficiency and reduce test cost.

Details

Site Map