Please enter search keywords!

Site Map

Site Map

PXIe Source Measure Unit

S2011C

Single-channel PXIe SMU


The 2011C is an economical and efficient single-channel PXIe Source/ Measure Units (SMUs), which supports most of the PXIe chassis manufacturers. It supports multi-card synchronization, and can be integrated into the production test system to improve the test efficiency of the system and reduce the cost, and supports Adaptive PFC.

Features

  • High Sampling Rate

    Up to 1M ADC sampling rate
  • High Range

    Range: ±60 V, ±3 A(DC), ±10 A(pulse)
  • High Resolution

    The minimum measurement resolution can reach 100fA / 100nV
  • Easy to Expand

    It is used in standard PXIe chassis to easily realize multi-channel expansion

Functions and Advantages

  • (5) Function In One Body

    Voltage source
    Current source
    Ammeter
    Voltmeter
    Electronic load
  • ♦ Three quadrants as the source: the actual polarity of output V / I follows the source setting.
    ♦ The four quadrants are loads: CC and CV cooperate. When the load is used, the polarity of the load setting is opposite to the source polarity.
  • Can Test Various Equipment

  • Capture More Measurement Data

    ♦ 6.5-digit resolution: enjoy best-in-class 6.5-digit sourcing and measurement resolution.
    ♦ 100 fA / 100 nV resolution: excellent sensitivity for setting and measuring.
    ♦ 1M points / second: provide high-speed measurement, and can quickly set / digitize the rate to any waveform generator / list scan.
  • Rich Scanning Function

  • DC I-V Output Capacity

  • Pulse I-V Output Capacity

Voltage Programming and Measurement Specifications





Voltage Accuracy
Range Programming Resolution Accuracy (1 Year)
± (% reading+ offset)
Typical Noise(RMS)
0.1 Hz-10Hz
±60 V 10 μV 0.02%+3 mV 200 μV
±6 V 1 μV 0.02%+0.3 mV 60 μV
±0.6 V 100 nV 0.02%+50 μV 20 μV
Temperature Coefficient ±(0.15 × accuracy)/°C (0℃-18℃, 28℃-50℃)
Settling Time <50μs (typical)
Overshoot <±0.1% (typical.normal.step is 10% to 90% range, full range, resistive load)
Noise 10Hz-20MHz

6V voltage source, 3A resistive load, <5 mVrms



Current Programming and Measurement Specifications










Current Accuracy
Range Programming Resolution Accuracy (1 Year)
± (% reading+ offset)
Typical Noise(RMS)
0.1 Hz-10Hz
±10 A[1] 1 μA 0.03% + 2mA 20 μA
±3 A 1 μA 0.03% + 2 mA 20 μA
±1 A 100 nA 0.03% + 90 μA 3 μA
±100 mA 10 nA 0.03% + 9 μA 200 nA
±10 mA 1 nA 0.03% + 900 nA 20 nA
±1 mA 100 pA 0.03% + 90 nA 2 nA
±100 μA 10 pA 0.03% + 9 nA 200 pA
±10 μA 1 pA 0.03% +1 nA 30 pA
±1 μA 100 fA 0.03% + 200 pA 5 pA
Temperature Coefficient ±(0.15 × accuracy)/°C (0℃-18℃, 28℃-50℃)
Settling Time <100μs (typical)
Overshoot <±0.1% (typical.normal.step is 10% to 90% range, full range, resistive load)

[1] 10A range is available only for pulse mode, accuracy specifications for 10A range are typical



Pulse Source Specifications (4W)


Minimum Programmable Pulse Width 100 μs
Pulse Width Programming Resolution 1 μs
Pulse Width Programming Accuracy ±10 μs
Pulse Width Jitter 2 μs
Pulse Width Definition The time from 10% leading to 90% trailing edge as follows


Item Maximums Maximum Pulse Width Maximum Duty Cycle
1 0.4 A/50 V DC, no limit 1
2 1 A/20 V DC, no limit 1
3 3 A/6.6 V DC, no limit 1
4 10 A/20 V 1ms 0.05
5 10 A/50 V

400 μs

0.02



Typical Pulse Performance(4W)


Source Range Typical Rise Time[1] Typical Settling Time[2] Test load


Voltage

50 V 250 μs 400 μs NO load
5 V 40 μs 100 μs NO load



Current

10 A~100 μA 90 μs 250 μs Full load[3]
10 μA 120 μs 300 μs Full load[3]
1 μA 300 μs 600 μs Full load[3]


[1] Leading edge, the time from 10% leading to 90% leading
[2] The time required from Pulse out 0 to reach within 1% of final value

[3] Test condition: Normal, resistive load 6V maximum output



Typical Output Settling Time



Source


Range
Output Settling Time[1]


Condition
Fast[2] Normal Slow


Voltage
60 V <120 μs <300 μs <1 ms


Time required to reach within 0.1% of final value at open load condition.

Step is 10% to 90% range
6 V <30 μs <50 μs <300 μs
0.6 V <30 μs <50 μs <300 μs


Current
3 A~100 μA <50 μs <100 μs <0.8 ms


Time required to reach within 0.1% (0.3% for 3 A range) of final
value at short condition.
Step is 10% to 90% range
10 μA <100 μs <150 μs <0.8 ms
1 μA <300 μs <400 μs
<1 ms


[1] Output transition speed: Fast, Normal, Slow. Users can adjust the APFC parameters based on the load characteristics to obtain precision, and fast output characteristics

[2] Slow mode is recommended for overshoot sensitive equipment, Fast mode may have overshoot on output in some condition




Sampling Rate and NPLC Setting


Setting Range
NPLC 0.00005 PLC ~ 10 PLC
Sampling Rate 5 sps ~ 1 Msps



Derating Accuracy with PLC Setting< 1 PLC


Add % of range using the following table for measurement with PLC < 1

 


PLC
Range
600 mV  6 V 60 V1 μA 10 μA 100 μA to 100 mA 1 A to 3 A 
0.1 0.02% 0.01% 0.01% 0.02% 0.01% 0.01% 0.01%
0.01 0.30% 0.03% 0.02% 0.20% 0.04% 0.02% 0.02%
0.001 3.20% 0.40% 0.10% 2.50% 0.40% 0.03% 0.03%



Supplemental Characteristics


Sensing Modes 2-wire or 4-wire (Remote-sensing) connections
Maximum Sense Lead Resistance 1 KΩ for rated accuracy
Max Voltage Between High Force and High Sense 2 V
Maximum Output Voltage in Output Connector >range 105%(60V range>60.5V)
Sweep Sweep step time: from 20μs to 16s, Max: 8K point
Auto Range Support. Turn off output is recommended for overshoot sensitive equipment before range change
Source Delay Support. It is recommended that users set appropriate source delay to obtain higher accuracy
Over Temperature Protection The output will be turned off (also disable operation) when the SMU internal temperature is
detected higher than 85 degrees.
When the temperature returns to less than 65 degrees, operation recover
Other Abnormal Protection Power reset, recover operation or hardware damage

Similar recommendation

Optical Network Test
Optical Network Test

Optical communication network plays an important role in the rapid development of big data, cloud computing, 5G communication and other markets.
Semight offers various of instruments for optical Transceiver/Component testing, including wide bandwidth sampling oscilloscope, NRZ/PAM4 bit error ratio tester , burst error ratio tester, fast wavelength meter, optical spectrum analyzer, high precise source measure unit, 400G network analyzer ,optical power meter, optical attenuator, optical switch etc. We provide cost-effective, complete solutions for optical testing.

Details
Electronic Measurement
Electronic Measurement

The high-precision source meter integrates the functions of voltage source, current source, voltmeter, ampere meter, and electronic load in one, which is widely used in high-precision IV test and measurement for various discrete components, photovoltaic, green energy, battery and other industries. Semight provides high-precision benchtop source meters and plug-in PXIe source meter modules of standard PXIe chassis, fully meeting the application of various test scenarios.

Details
Optical Chip Test
Optical Chip Test

Burn-in testing of laser is an important method to ensure the reliability of laser. Through the test of COC or bare die, the early failure of laser caused by the defects in the process of laser production can be screened out in advance. Semight provides a complete solution from bare die to COC, from high temperature(150℃ or higher) to low temperature (-40℃), with CoC automatic loading and unloading system, forming a complete test solution, Semight's laser chip burn-in/load/unload test system has been widely recognized by the market.

Details
Power Semiconductor Test
Power Semiconductor Test

The semiconductor front-end test is mainly used in the wafer processing to check whether the processing parameters of the wafer products meet the design requirements or there are defects affecting the yield after each step of the manufacturing process. The semiconductor back-end test equipment is mainly used after wafer processing to check whether the performance of the chip meets the requirements, which belongs to the electrical performance test. Semight provides solutions such as Wafer Level Burn In system and Known Good Die handler for SiC testing, offering the value to customer in test efficiency improvement and test cost reduction.

Details
Log in

Account number

Password

Register an account

Name

Please enter your name *

E-mail

Please enter your email address *

E-mail verfication code

Please enter your email verification code

Phone

Please enter your contact number

Password

Please enter your login password *

Confirm Password

Please enter your login password again *
Reset password

E-mail address

Please enter your email number *

E-mail verification code

Please enter your email verification code

New Password

Please enter your login password *

Confirm Password

Please enter your login password again *