Please enter search keywords!

Site Map

Site Map

High precision desktop source meter

S2036H

Dual-Channel Precision Source Meter


The Semight Instruments S2036H is a compact and cost-effective single channel desktop power supply/measurement unit (SMU), which has a wide range of voltage source (± 200V) and current source (± 1A DC and ± 3A pulse) functions, excellent accuracy, 6-and-a-half-bit display (minimum 1fA/100nV display resolution), and excellent color LCD graphical user interface (GUI).



Features

  • High range

    ±200 V、±1 A (DC)、±3A (Pulse)
  • High resolution

    The minimum measurement resolution can reach 1 fA/100 nV
  • High sampling rate

    Supports up to 1M ADC sampling rate
  • Threshold trigger

    Hardware high-speed IO, capable of threshold triggering, enabling efficient interaction between output measurement values and user systems

Functions and advantages

  • DC I-V Out capability

  • Pulse Output capability

Voltage source/ measurement specifications  

Voltage programming accuracy

Range

Programming resolution

Accuracy (1 Year)

± (% reading+ offset)

Typical Noise (RMS)

0.1 Hz-10 Hz

±200 V

100 μV

0.03%+10 mV

0.4 mV

±40 V

10 μV

0.03%+2 mV

100 μV

±20 V

10 μV

0.03%+1 mV

50 μV

±2 V

1 μV

0.03%+100 μV

10 μV

±0.6 V

100 nV

0.03%+50 μV

2 μV

Temperature coefficient

±(0.15 × accuracy)/℃ (0℃-18℃,28℃-50℃)

Settling time

<50 μs (typical)

Overshoot

<±0.1% (Typical. Normal mode. Step is 10 % to 90 % range, full range, resistive load)

Noise 10Hz-20MHz

20V voltage source,1A resistive load, <5 mVrms


Current source/ measurement specifications

Current programming accuracy

Range

Programming resolution

Accuracy (1 Year)

± (% reading+ offset)

Typical Noise (RMS)

0.1 Hz-10 Hz

±3 A1

1 μA

0.03% + 2 mA

20 μA

±1 A

100 nA

0.03% + 90 μA

4 μA

±100 mA

10 nA

0.03% + 9 μA

600 nA

±10 mA

1 nA

0.03% + 900 nA

60 nA

±1 mA

100 pA

0.03% + 90 nA

6 nA

±100 μA

10 pA

0.03% + 9 nA

700 pA

±1 μA

100 fA

0.03% + 200 pA

20 pA

±10 nA2

10 fA

0.06% +9 pA

600 fA

±1 nA2

1 fA

0.1% +3 pA

60 fA

±100 pA2

1 fA

0.3% +1 pA

30 fA

Temperature coefficient

±(0.15 × accuracy)/℃ (0℃-18℃,28℃-50℃)

Settling time

<100 μs (typical)

Overshoot

<±0.1% (Typical. Normal mode. Step is 10 % to 90 % range, full range, resistive load)

1,3 A range is available only for pulse mode, accuracy specifications for 3 A range are typical.

2,Additional specification conditions: 10 PLC setting


Pulse source specifications (4W)

Minimum programmable pulse width

100 μs

Pulse width programming resolution

1 μs

Pulse width programming accuracy

±10 μs

Pulse width jitter

2 μs

Pulse width definition

The time from 10 % leading to 90 % trailing edge as follows





Item

Maximums

Maximum pulse width

Maximum duty cycle

1

0.1 A/200 V

DC, no limit

100%

2

1 A/20 V

DC, no limit

100%

3

3 A/6 6.6 V

1 ms

5%

4

3 A/160 V

400 μs

2%

  


Typical Pulse Performance(4W)

Source

Maximum output

Typical rise time 1

Typical Settling Time2

Test load

Voltage

 

160 V

800 μs

1.2 ms

NO load

5 V

40 μs

100 μs

NO load

Current

 

 

 

 

 

3 A~1 mA

90 μs

250 μs

Full load3

100 μA

120 μs

400 μs

Full load3

1 μA

300 μs

600 μs

Full load3

10 nA

5 ms

10 ms

Full load3

1 nA

10 ms

50 ms

Full load3

100 pA

100 ms

500 ms

Full load3

1, Leading edge, the time from 10 % leading to 90 % leading

2, The time required from Pulse out 0 to reach within 1 % of final value

3, Test condition: Normal, resistive load 6V maximum output



Typical output settling time

Source

Range

Output settling time1

Condition

Fast2

Normal

Slow

Voltage

200 V

<500 μs

<1 ms

<2 ms

Time required to reach within 0.1 % of final value at open load condition. Step is 10 % to 90 % range

40 V

<200 μs

<400 μs

<900 μs

20 V

<60 μs

<100 μs

<500 μs

2 V

<50 μs

<50 μs

<50 μs

0.6 V

<50 μs

<50 μs

<50 μs

Current

3 A~1 mA

<50 μs

<100 μs

<0.8 ms

Time required to reach within 0.1 % (0.3 % for 3 A range) of final value at short condition. Step is 10 % to 90 % range

100 μA

<100 μs

<150 μs

<0.8 ms

1 μA

<1 ms

<1 ms

<1 ms

10 nA

<10 ms

<10 ms

<10 ms

1 nA

<50 ms

<50 ms

<50 ms

100 pA

<500 ms

<500 ms

<500 ms

1,Output transition speed:Fast, Normal, Slow. Users can adjust the APFC parameters based on the load characteristics to obtain precision, and fast output characteristics

2, Slow mode is recommended for overshoot sensitive equipment, Fast mode may have overshoot on output in some condition



Sampling rate and NPLC setting

Setting

Range

NPLC

0.00005 PLC ~ 10 PLC

Sampling Rate

5 sps ~ 1 Msps



Derating accuracy with PLC setting(PLC<1)

Add % of range using the following table for measurement with PLC < 1

PLC

Range

0.6 V

2 V

6 V

20 V

200 V

100 pA to

1 μA

100 μA to

100 mA

1 A to 3 A

0.1

0.02%

0.02%

0.01%

0.01%

0.01%

0.02%

0.01%

0.01%

0.01

0.3%

0.3%

0.3%

0.03%

0.02%

0.2%

0.02%

0.02%

0.001

3.20%

3.20%

3.20%

0.04%

0.10%

2.50%

0.03%

0.03%

Download

Name
Version
Release time
Download

Democode

Name
Version
Release time
Download

Similar recommendation

Optical Network Test
Optical Network Test

Optical communication network plays an important role in the rapid development of big data, cloud computing, 5G communication and other markets.
Semight Instruments offers various of instruments for optical Transceiver/Component testing, including wide bandwidth sampling oscilloscope, NRZ/PAM4 bit error ratio tester , burst error ratio tester, fast wavelength meter, optical spectrum analyzer, high precise source measure unit, 400G network analyzer ,optical power meter, optical attenuator, optical switch etc. Provide cost-effective complete solutions.

Details
Electrical Performance Test
Electrical Performance Test

The high-precision source meter integrates the functions of voltage source, current source, voltmeter, ampere meter, and electronic load in one, which is widely used in high-precision IV test and measurement for various discrete components, photovoltaic, new energy, battery and other industries. Semight Instrument provides high-precision benchtop source meters and plug-in PXIe source meter modules of standard PXIe chassis, fully meeting the application of various test scenarios.

Details
Optical Chip Test
Optical Chip Test

Burn-in testing of laser is an important method to ensure the reliability of laser. Through the test of COC or bare die, the early failure of laser caused by the defects in the process of laser production can be screened out in advance. Semight Instrument provides a complete solution from bare die to COC, from high temperature(150℃ or higher) to low temperature (-40℃), with CoC automatic loading and unloading system, forming a complete test solution, Semight Instrument's laser chip burn-in/load/unload test system has been widely recognized by the market.

Details
Power Chip Test
Power Chip Test

The semiconductor front-end test is mainly used in the wafer processing to check whether the processing parameters of the wafer products meet the design requirements or there are defects affecting the yield after each step of the manufacturing process. The semiconductor back-end test equipment is mainly used after wafer processing to check whether the performance of the chip meets the requirements, which belongs to the electrical performance test. Semight Instrument provide integrated solutions such as wafer burn in and known good die tester, improve test efficiency and reduce test cost.

Details
After login Download Now!

account number

password

Registered account Download Now!

full name

Please enter your name *

e-mail address

Please enter your email address *

Email verification code

Please enter your email verification code

Telephone

Please enter your contact number *

password

Please enter your login password *

Confirm Password

Please enter your login password again *
Retrieve password

e-mail address

Please enter your email number *

Email verification code

Please enter your email verification code

New Password

Please enter your login password *

Confirm Password

Please enter your login password again *