High precision desktop source meter
S2022H
8-Channel Precision Source Meter
The S2022H precision source meter is compact and cost-effective bench-top Source/Measure Units (SMUs) with the capability to source and measure both voltage and current. These capabilities make the S2022H ideal for IV (current versus voltage) measurement tasks that require both high resolution and accuracy.
Features
High range
Range: ± 30 V, ± 500 mA (DC)
High resolution
The minimum measurement resolution can reach 100 pA/100 μV
High sampling rate
Supports up to 500K ADC sampling rate
Threshold trigger
Hardware high-speed IO, capable of threshold triggering, enabling efficient interaction between output measurement values and user systemsFeatures and Benefits
I-V output capability
|
Voltage programming accuracy |
Range |
Programming Resolution |
Accuracy (1 year) ± (% reading+offset) |
Typical noise (RMS) 0.1 Hz-10 Hz |
|
± 30 V |
1 mV |
0.03%+4 mV |
1000 μV |
|
|
± 6 V |
200 μV |
0.03%+1 mV |
100 μV |
|
|
Temperature coefficient |
± (0.15 x accuracy)/℃ (0 ℃ -18 ℃, 28 ℃ -50 ℃) |
|||
|
Channel1 |
CH1 to CH8 |
|||
|
Output power |
Ch1 Ch4: 3 W per channel and 6W total Ch5 Ch8: 3 W per channel and 6W total |
|||
|
Setting Time |
< 200μs (typical) |
|||
|
Overshoot |
< ± 0.1% (Typical, Normal, Step is 10% to 90%, full range, resistive load) |
|||
|
Noise 10Hz-20MHz |
6V voltage source, 0.5 A resistive load,< 3 mVrms |
|||
1. Channels are isolated from earth ground, but ch1 to ch4 share a common LO. but ch5 to ch8 share a common LO.
|
Current programming accuracy |
Range |
Programming Resolution |
Accuracy (1 year) ± (% reading+offset) |
Typical noise (RMS) 0.1 Hz-10 Hz |
|
± 500 mA1 |
20 μA |
0.05%+100 μA+ Vo * 25 μA |
10 μA |
|
|
± 100 mA |
4 μA |
0.05%+10 μA+ Vo * 5 μA |
1 μA |
|
|
± 10 mA |
400 nA |
0.05%+5 μA+ Vo * 500 nA |
100 nA |
|
|
± 1 mA |
40 nA |
0.05%+500 μA+ Vo * 50 nA |
10 nA |
|
|
± 100 μ A |
4 nA |
0.05%+50 nA+ Vo * 5 nA |
1 nA |
|
|
± 10 μA |
400 pA |
0.05%+20 nA+ Vo * 500 pA |
150 pA |
|
|
Temperature coefficient |
± (0.15 x accuracy)/℃ (0 ℃ -18 ℃, 28 ℃ -50 ℃) |
|||
|
Channel2 |
CH1 to CH8 |
|||
|
Output power |
Ch1 Ch4: 3 W per channel and 6W total Ch5 Ch8: 3 W per channel and 6W total |
|||
|
Set Time |
< 300 μs (typical) |
|||
|
Overcharge |
< ± 0.1% (Typical, Normal, Step is 10% to 90%, full scale point, resistive load test) |
|||
1. 500mA range is available only for 6V voltage range
2. Channels are isolated from earth ground, but ch1 to ch4 share a common LO. but ch5 to ch8 share a common LO.
|
Voltage measurement accuracy |
Range |
Measurement Resolution |
Accuracy (1 year) ± (% reading+offset) |
|
± 30 V |
300 μV |
0.03%+4 mV |
|
|
± 6 V |
60 μV |
0.03%+1 mV |
|
|
Temperature coefficient |
± (0.15 x accuracy)/℃ (0 ℃ -18 ℃, 28 ℃ -50 ℃) |
||
|
Current measurement accuracy |
Range |
Measurement Resolution |
Accuracy (1 year) ± (% reading+offset) |
|
± 500 mA1 |
10 μA |
0.05%+100 μA+ Vo * 25 μA |
|
|
± 100 mA |
1 μA |
0.05%+10 μA+ Vo * 5 μA |
|
|
± 10 mA |
100 nA |
0.05%+5 μA+ Vo * 500 nA |
|
|
± 1 mA |
10 nA |
0.05%+500 nA+ Vo * 50 nA |
|
|
± 100 μA |
1 nA |
0.05%+50 nA+ Vo * 5 nA |
|
|
± 10 μA |
100 pA |
0.05%+20 nA+ Vo * 500 pA |
|
|
Temperature coefficient |
± (0.15 x accuracy)/℃ (0 ℃ -18 ℃, 28 ℃ -50 ℃) |
||
1.500mA range is available only for 6V voltage range
|
Source |
Range |
Output setting time |
Condition |
||
|
Fast 1, 2 |
Normal1 |
Slow1 |
|||
|
Voltage |
30 V |
< 400 μs |
< 1.5ms |
< 2.8 ms |
Time required to reach within 0.1 % of final value at open load condition. Step is 10 % to 90 % range |
|
6 V |
<250 μs |
<780 μs |
<2.8 ms |
||
|
Current |
± 500 mA |
<50 μs |
<330 μs |
<2.5 ms |
Time required to reach within 0.1 % of final value at short condition. Step is 10 % to 90 % range |
|
±100 mA |
<50 μs |
<270 μs |
<2.5 ms |
||
|
±10 mA |
<50 μs |
<270 μs |
<2.5 ms |
||
|
±1 mA |
<100 μs |
<290 μs |
<2.5 ms |
||
|
±100 μA |
<150 μs |
<5 ms |
<2.5 ms |
||
|
±10 μA |
<250 μs |
<3 ms |
<2.5 ms |
||
1. Output transition speed：Fast, Normal, Slow
2. Slow mode is recommended for overshoot sensitive equipment, Fast mode may have overshoot on output in some condition
文档下载
DS70000数据手册 DS70000数据手册 DS70000数据手册 DS70000数据手册 Democode
DS70000数据手册 DS70000数据手册 DS70000数据手册 DS70000数据手册 Similar recommendation
Optical communication network plays an important role in the rapid development of big data, cloud computing, 5G communication and other markets.
Semight Instruments offers various of instruments for optical Transceiver/Component testing, including wide bandwidth sampling oscilloscope, NRZ/PAM4 bit error ratio tester , burst error ratio tester, fast wavelength meter, optical spectrum analyzer, high precise source measure unit, 400G network analyzer ,optical power meter, optical attenuator, optical switch etc. Provide cost-effective complete solutions.
The high-precision source meter integrates the functions of voltage source, current source, voltmeter, ampere meter, and electronic load in one, which is widely used in high-precision IV test and measurement for various discrete components, photovoltaic, new energy, battery and other industries. Semight Instrument provides high-precision benchtop source meters and plug-in PXIe source meter modules of standard PXIe chassis, fully meeting the application of various test scenarios.
Details
Burn-in testing of laser is an important method to ensure the reliability of laser. Through the test of COC or bare die, the early failure of laser caused by the defects in the process of laser production can be screened out in advance. Semight Instrument provides a complete solution from bare die to COC, from high temperature(150℃ or higher) to low temperature (-40℃), with CoC automatic loading and unloading system, forming a complete test solution, Semight Instrument's laser chip burn-in/load/unload test system has been widely recognized by the market.
Details
The semiconductor front-end test is mainly used in the wafer processing to check whether the processing parameters of the wafer products meet the design requirements or there are defects affecting the yield after each step of the manufacturing process. The semiconductor back-end test equipment is mainly used after wafer processing to check whether the performance of the chip meets the requirements, which belongs to the electrical performance test. Semight Instrument provide integrated solutions such as wafer burn in and known good die tester, improve test efficiency and reduce test cost.
Detailsmailbox
Service hotline
follow
full name
e-mail address
Email verification code
Telephone
password
Confirm Password
e-mail address
Email verification code
New Password
Confirm Password
Datasheet
Apply for prototype
