High speed Transceiver ATE
ATE8108/ATE8104
Optical Transceiver Tester
The system integration software encapsulates various parameters in the optical module test. Users can quickly build the test system with blocks to accelerate the introduction of new products into mass production.
The whole system adopts the multi-channel parallel test and combines the software with hardware to give full play to the functions of the instrument and software and greatly improve the test efficiency of unit products.
Features
Plug-in Optical paltform
Each functional module is encapsulated into a plug-in module, allowing users to flexibly optimize hardware configuration
Software platform
The software is highly encapsulated, and each sub-function module of the software can be arbitrarily called and combined at will
Multi-channel parallel testing
Increase the number of channels, parallel test, greatly improve test efficiency
Integrated TEC temperature control system
Support module -40℃~90℃ temperature cycle testFeatures and Benefits
Plug-in optical platform
Integrate common optical instruments Optical power meter/optical switch/optical decay/optical CDR Integrate common passive components MUX/DEMUX/Splitte Flexible configuration
Integrated thermal cycling test system
TEC-based temperature control system
Platform software system
Subfunction Modularization
Automatically generate software reports
Pass rate analysisl Each functional module is encapsulated into a card module, which allows users to flexibly optimize hardware configuration
l The PC machine controls and manages the test host through the PCI bus interface card
l The test host adopts a 19-inch standard cabinet with 17 slots that support different hardware modules
l The hardware is highly integrated, which improves the stability of the equipment and the convenience of connection
l The software is highly encapsulated, and the sub-functional modules of the software can be called and combined randomly
l The multi-channel parallel test increases the number of channels, and the parallel test greatly improves the test efficiency
l The integrated TEC temperature control system supports the -40℃~90℃ temperature loop test of the modules
l Support multiplex: 100G QSFP, 200G QDD, 400G QDD module parallel test
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