High speed Transceiver ATE
ATE8104/ATE8108
Optical Transceiver Tester
The ATE (Automatic Test Equipment) integrated testing system combines various test cases for transceiver and integrates the sub-functional modules according to the functional requirements ratio. Users can flexibly configure the system according to their actual testing needs, improving the utilization of transceiver test instruments and effectively reducing testing costs. The system's integrated software encapsulates various parameters in transceiver testing, allowing users to quickly build the test system like building blocks and accelerate the mass production introduction of new products.
The entire system adopts multi-channel parallel testing, combining software and hardware to fully utilize the functions of instruments and software, significantly improving the testing efficiency of each unit product.
Features
Plug-in Optical paltform
Each functional module is encapsulated into a plug-in module, allowing users to flexibly optimize hardware configuration
Software platform
The software is highly encapsulated, and each sub-function module of the software can be arbitrarily called and combined at will
Multi-channel parallel testing
Increase the number of channels, parallel test, greatly improve test efficiency
Integrated TEC temperature control system
Support module -10~85℃ temperature cycle testFeatures and Benefits
Plug-in optical platform
Integrate common optical instruments Optical power meter/optical switch/optical decay/optical CDR Integrate common passive components MUX/DEMUX/Splitte Flexible configuration
Integrated thermal cycling test system
TEC-based temperature control system
Platform software system
Subfunction Modularization
Automatically generate software reports
Pass rate analysis
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