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December Event Highlights: Spotlight on Cutting-Edge Semiconductor Technology
Date:2024.12.07 Visits:317

Starting from December 11, Semight is going to showcase the 3500V high voltage SMU S3030F, 200V Single/Dual-Channel Precision SMU, PLR0010 Package-Level Reliability Test Equipment, Parallel Parametric Test System, and PXIe SMU at two significant exhibitions, namely ICCAD-Expo 2024 and SEMICON Japan 2024. Semight cordially invites you to visit the exhibition venues to keep abreast of the latest advancements in semiconductor technology and acquire in-depth understandings of the extensive opportunities within the testing domain.


01 ICCAD-Expo 2024


ICCAD-Expo 2024, with the theme of "Smart Shanghai, Empowering the World with Chips", will delve deeply into the opportunities and challenges that the integrated circuit industry confronts, especially those in integrated circuit design.


Date: December 11th - 12th, 2024

Venue: Shanghai World Expo Exhibition and Convention Center

Booth: No. L03


Parallel Parametric Test System WAT6600

WAT6600 is a high efficiency parallel parametric test system that can quickly perform accurate DC measurements, capacitance measurements, and other high-frequency applications (such as ring oscillator measurements), flash memory tests and so on. WAT6600 supports up to 48 pin configurations with Per-pin SMU and Per-pin PGU resource. Each pin can source and measure individual current or voltage by Per-pin SMU and generate fast, multi-level, high voltage pulse for advanced flash memory testing by per-pin PGU. The system also supports access to external instruments such as DVM, LCR, Signal Analyzer, etc. via 6 auxiliary input ports and is able to achieve high-precision measurements of voltage, capacitance, frequency, etc.



PXIe SMU

PXIe Source Meter Module, supports most of the PXIe chassis. It is convenient to integrate and extend to large-scale integrated test system.

High-precision 4-quadrant SMU

Support ADC sampling rate up to 1M

Display resolution up to 10fA/100nV

Max. 200V voltage /3A DC/10A pulse

Measurement accuracy<10PA



 Package-Level Reliability Test Equipment PLR0010


Supports TDDB/HCI/NBTI/EM test modes

Supports multi-channel measurement, enabling automatic switching between different test modes

Utilizes Micro Oven architecture with up to 4 temperature zones, each oven can independently control temperature up to 250°C

Capable of testing up to 960 DUTs simultaneously


02 SEMICON Japan 2024


SEMICON Japan represents the premier event within the semiconductor manufacturing supply chain. This year's exhibition will center around presenting smart applications propelled by semiconductor technology, with particular emphasis on automotive and the Internet of Things (IoT).

Date: December 11th - 13th, 2024

Venue: Tokyo International Exhibition Center

Booth: No. 6231


3500V High Voltage SMU S3030F

The Semight S3030F is a compact and cost-effective single channel high voltage, high-power supply/measurement unit that can simultaneously output and measure voltage and current, it can provide a maximum power output of ± 3500V, ± 120mA (DC), 10 GΩ, and 180W, and can be widely used in testing and research fields such as power semiconductor characteristics, GaN, SiC characterization, composite materials, and high-voltage leakage current. It boasts a minimum measurement resolution of 10fA/100nV.


200V Dual-Channel Precision SMU S2036H

The Semight S2036H is a compact and cost-effective single channel benchtop power supply/measurement unit (SMU), which has a wide range of voltage source (± 200V) and current source (± 1A DC and ± 3A pulse) functions, excellent accuracy, 6-and-a-half-bit display (minimum 1fA/100nV display resolution), and excellent color LCD graphical user interface (GUI).


200V Single-Channel Precision SMU S3012H

The S3012H precision source meter is compact and cost-effective bench-top Source/Measure Units (SMUs) with the capability to source and measure both voltage and current. These capabilities make the S3012H ideal for a wide variety of IV (current versus voltage) measurement tasks that require both high resolution and accuracy.





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