APD TO Test System-Semight Instruments

PD/APD Burn-In&Tester

TO6201-PD

APD TO Test System

The APD TO test system of Semight Instruments can provide the comprehensive parameter test of APD TIA or PIN TIA TO under room temperature, support the high-precision scanning of APD V-I curve, support the Vbr test under fixed point current, support the dark current test under fixed point voltage, responsivity test under fixed point power, and support the parameter test of APD TIA TO and PIN TIA TO. Moreover, it is compatible with the output of single-mode and multi-mode light sources, and supports the responsivity and digital amplitude signal testing under multiple light sources.

Datasheet

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Feature

Compatible with general
Compatible with conventional TO-can device aging daughter board clamp
Dark current test
Support VBR and dark current test
Responsiveness test
Support responsiveness test under multi wavelength
Support Na
Support Na level photodetector dark current test
Wide temperature range
Room temperature, 50~100 ℃
No EOS
No EOS

System index	Dimensions（mm）	1000L900W1300H
	Supported fixture types	Standard 8X8 Fixture
	Test machine control	The software supports the control function of the test machine. If the same fixture is tested on different test machines before and after burn-in, the software will automatically generate an alarm prompt.
	Test configuration control	The software supports test configuration management and control, including test instrument, test algorithm, test sequence, test result judgment, etc.
	Test data	Support all test data required by users / Support MES related requirements

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