Source Meter-SMU-IV test-measurement-Semight Instruments

Electronic Measurement

The high-precision source measure units integrates the functions of voltage source, current source, voltmeter, ampere meter, and electronic load in one, which is widely used in high-precision IV test and measurement for various discrete components, photovoltaic, green energy, battery and other industries. Semight provides high-precision benchtop SMU and plug-in PXIe SMU of standard PXIe chassis, fully meeting the application of various test scenarios.

S2019C

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4-channel PXIe SMU S2019C

4（PXIe）

±40 V

±500mA

±1A

4 W

1 pA/1 μV

1M
S0342C

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4-channel PXIe SMU S0342C

4（PXIe）

±30 V

±500mA

±500mA

3 W

100 pA/60 μV

500K
WAT6300

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High Voltage Serial Parametric Test System

WAT6300 is a serial high-voltage semiconductor parametric test system.The system can be extended up to 24 output channels with high-voltage 3500 and up to 48 output channels with 600V.
S2011C

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Single-channel PXIe SMU S2011C

1（PXIe）

±60 V

±3 A

±10 A

20 W

100 fA/100 nV

1 M
WAT6200S

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Serial Parametric Test System

WAT6200S is a serial parametric test system. It built-in a low-leakage switch matrix with 14 input ports and configurable, maximum 48 output ports.It supports up to 8 SMU inputs.
WAT6600

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Parallel Parametric Test System

WAT6600 is a high efficiency parallel parametric test system.It supports up to 48 pin configurations with Per-pin SMU and Per-pin HV-SPGU resource.
S2012C

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Single-channel PXIe SMU S2012C

1（PXIe）

±200 V

±1 A

±3 A

20 W

10 fA/100 nV

1 M
S2013C

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Single-channel PXIe SMU S2013C

1（PXIe）

±200 V

±1 A

±3 A

20 W

100 fA/100 nV

1 M
S2014C

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12-channel PXIe SMU S2014C

12（PXIe）

±10 V

±50 mA

±50 mA

/

1 pA/1 μV

1 M

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