Please enter search keywords!

Site Map

Site Map

Laser Diode Test

AL6201

CoC Sorting System


Semight Instruments CoC Sorting System AL6201 is an automatic CoC loading and unloading equipment specially designed for CoC BI system. The modular design is adopted, so that the product can be quickly installed, disassembled, maintained and switched. AL6201 can automatically load CoC or CoS into the BI fixture, directly put the BI fixture into the CoC BI system for BI or into the CoC test system for testing. Moreover, AL6201 can also be used as a separate sorting system of bare chip or CoC independently.



Feature

  • Fast

    Single product loading < 7S, unloading < 6S;
  • High-precision

    Automatic loading and unloading position accuracy  ± 50um;
    The maximum force of the suction nozzle is adjustable, no more than 24g;
  • High-success

    One time success rate of loading & unloading >99.5%
  • Good scalability

    Optional sorting according to the test results

Functions and advantages

  • Powerful hardware function

    Chipid identification
    Automatic positioning
  • Rich software functions and humanized operation interface

    Support the configuration of loading / unloading mode, material box mode, and parameter Setting of all motion axes and cameras;
    Support full-automatic, semi-automatic and manual debugging mode selection;
    Support configuration database,
    MES interface can be provided according to customer requirements.
















System Specification

Maximum CoC size <5X5mm
Minimum suction nozzle vacuum area 100um X 100um
Number of Gel Pak Up to 8 for 2 inches (excluding blue film)
Number of blue films 1 for 6 inches
Number of BI fixtures 4
ID recognition success rate 99% (no obvious defect or occlusion on ID )
CoC loading time 7s/pcs
CoC unloading time 6s/pcs
One-time success rate of transfer 99%
Loading and unloading position accuracy <±50um
Adaptive range of incoming angle ±30 degree
Suction force of nozzle <24g adjustable
Assembly accuracy
X-axis accuracy Position accuracy±20um, repeat accuracy±3um
X axis accuracy of left loading movement Position accuracy±20um, repeat accuracy±3um
Y axis accuracy of left loading movement Position accuracy±20um, repeat accuracy±3um
Right loading Y-axis accuracy Position accuracy±20um, repeat accuracy±3um
Right loading rotary shaft Position accuracy 0.1 degree, repetition accuracy ± 0.05 degree, resolution 0.01 degree
Position camera 3.7um/pixel







Other Parameters

System size(mm) 1280*1010*1870(L*W*H)
Compressed air pressure 0.4-0.6Mpa
Input power supply AC200-240V,50/60Hz 10A
System weight <500kg
Computer manufacturer Advantech
Operating system Microsoft Windows 7/10
Software platform Microsoft .Net
Software language C#
Database SQL

Similar recommendation

Optical Network Test
Optical Network Test

Optical communication network plays an important role in the rapid development of big data, cloud computing, 5G communication and other markets.
Semight Instruments offers various of instruments for optical Transceiver/Component testing, including wide bandwidth sampling oscilloscope, NRZ/PAM4 bit error ratio tester , burst error ratio tester, fast wavelength meter, optical spectrum analyzer, high precise source measure unit, 400G network analyzer ,optical power meter, optical attenuator, optical switch etc. Provide cost-effective complete solutions.

Details
Electrical Performance Test
Electrical Performance Test

The high-precision source meter integrates the functions of voltage source, current source, voltmeter, ampere meter, and electronic load in one, which is widely used in high-precision IV test and measurement for various discrete components, photovoltaic, new energy, battery and other industries. Semight Instrument provides high-precision benchtop source meters and plug-in PXIe source meter modules of standard PXIe chassis, fully meeting the application of various test scenarios.

Details
Optical Chip Test
Optical Chip Test

Burn-in testing of laser is an important method to ensure the reliability of laser. Through the test of COC or bare die, the early failure of laser caused by the defects in the process of laser production can be screened out in advance. Semight Instrument provides a complete solution from bare die to COC, from high temperature(150℃ or higher) to low temperature (-40℃), with CoC automatic loading and unloading system, forming a complete test solution, Semight Instrument's laser chip burn-in/load/unload test system has been widely recognized by the market.

Details
Power Chip Test
Power Chip Test

The semiconductor front-end test is mainly used in the wafer processing to check whether the processing parameters of the wafer products meet the design requirements or there are defects affecting the yield after each step of the manufacturing process. The semiconductor back-end test equipment is mainly used after wafer processing to check whether the performance of the chip meets the requirements, which belongs to the electrical performance test. Semight Instrument provide integrated solutions such as wafer burn in and known good die tester, improve test efficiency and reduce test cost.

Details
After login Download Now!

account number

password

Registered account Download Now!

full name

Please enter your name *

e-mail address

Please enter your email address *

Email verification code

Please enter your email verification code

Telephone

Please enter your contact number *

password

Please enter your login password *

Confirm Password

Please enter your login password again *
Retrieve password

e-mail address

Please enter your email number *

Email verification code

Please enter your email verification code

New Password

Please enter your login password *

Confirm Password

Please enter your login password again *