Known Good Die
PB6400
KGD Test System
Feature
The flexible design is adopted
The handler with transport part (PB6400) is separated from the test part, so the strong expandability is providedMultiple parallel test
Maximum of 4 test stations are supported, and the different test station support different test conditions and itemsSupport dynamic and static parameter test
Up to 2000V/300A static test, 2000V/1200A dynamic testHigh temperature uniformity
room temperature ~ 200 ℃Parameter | Indicators |
Applicable products | SiC chip |
Wafer size | 6 inches and 8 inches |
Static parameters | Vds, Vth, Idss, Igss, Rds(on), Vsd |
Dynamic parameter | Eas, Rint, Ciss, Coss, Crss, Eoss |
Switch parameter | Isc, Td(on), Tr, Tf(off), Tf, Eon, Eoff, Trr, Qrr, Irrm, |
System power consumption | <10kW |
Nitrogen protection | 2~5Bar |
Temperature range | Room temperature~200℃ |
Number of AC test stations | Number of test stations which support customization |
Number of DC test stations |
Number of test stations which support customization |
Current and voltage overshoot | No overshoot under any circumstances |
MES docking | Support MES docking |
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